The INA1H182-SEP was biased in a variety of different conditions for SEE testing at the recommended minimum and recommended maximum supply voltages. Midsupply or GND was used for REF. Current was monitored over time for both supplies VS+, VS- and the instrumentation amplifier inputs -IN and +IN.

Input and supply voltages were provided by SMU PXI cards, connected with banana cables. The board used for testing incorporated jumpers can also test with high V_CM and 0V V_DIFF; low V_CM and high V_DIFF; and high V_CM and constant V_DIFF. For all testing, the device outputs were monitored using oscilloscope PXI cards, connected with BNC cables. A 100Ω of series isolation resistance was used to drive the cable capacitance. A 2kΩ output load to midsupply was present for all DUTs. The gain of the INA1H182-SEP is configured by the RG resistors. For SEL qualification, the device was configured on a gain of 1000V/V using a 49.4Ω RG resistor. For SET tests, RG was set to 499Ω for a gain of 100V/V.

Figure 4-3 shows an example of the INA1H182-SEP device mounted through a socket on a characterization board. During SEL qualification, the device was heated using forced hot air, maintaining an IC temperature at 125°C. During SEL testing, the devices were soldered into a coupon board, allowing direct airflow access to the heater. For SET testing, devices were mounted in a socket for the easy exchange of units.