SLVK265 March   2026 TRF0108-SEP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1 Overview
  5. 2 Single-Event Effects
  6. 3 Test Device and Evaluation Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 Depth, Range, and LETEFF Calculation
  9. 6 Test Set-Up and Procedures
  10. 7 Single-Event Latch-up (SEL) Results
  11. 8 Single-Event Transients (SET) Results
  12. 9 Event Rate Calculations
  13. 10Summary
  14.   A Total Ionizing Dose from SEE Experiments
  15.   B References

A Total Ionizing Dose from SEE Experiments

The production TRF0108-SEP is rated to a total ionizing dose (TID) of 30krad(Si), with 50krad(Si) as information-only data. In the course of the SEE testing, the heavy-ion exposures delivered approximately 1krad(Si) per 106 ions/cm2 run. The cumulative TID exposure for each device respectively, over all runs each underwent, was determined to be greater than 30krad(Si). The production TRF0108-SEP devices used in the studies described in this report stayed within specification and were fully-functional after the heavy-ion SEE testing was completed.