SLVK265 March   2026 TRF0108-SEP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1 Overview
  5. 2 Single-Event Effects
  6. 3 Test Device and Evaluation Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 Depth, Range, and LETEFF Calculation
  9. 6 Test Set-Up and Procedures
  10. 7 Single-Event Latch-up (SEL) Results
  11. 8 Single-Event Transients (SET) Results
  12. 9 Event Rate Calculations
  13. 10Summary
  14.   A Total Ionizing Dose from SEE Experiments
  15.   B References

Trademarks

Tektronix™ is a trademark of Tektronix Inc.

LabView™ is a trademark of National Instruments Corporation.

R&S® is a registered trademark of Rohde & Schwarz.

All trademarks are the property of their respective owners.