SLVK265 March   2026 TRF0108-SEP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1 Overview
  5. 2 Single-Event Effects
  6. 3 Test Device and Evaluation Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 Depth, Range, and LETEFF Calculation
  9. 6 Test Set-Up and Procedures
  10. 7 Single-Event Latch-up (SEL) Results
  11. 8 Single-Event Transients (SET) Results
  12. 9 Event Rate Calculations
  13. 10Summary
  14.   A Total Ionizing Dose from SEE Experiments
  15.   B References

3 Test Device and Evaluation Board Information

The TRF0108-SEP is packaged in a 12-pin RPV, WQFN - Flip-Chip RLF (WQFN-FCRLF, 12) package as shown in Figure 3-1. The TRF0108SEP-EVM evaluation board (EVM) was used to evaluate the single-event effects (SEE) of the TRF0108-SEP. Top view of the evaluation board used for the radiation testing in shown in Figure 3-2. Schematic of the evaluation board used for radiation testing is shown in Figure 3-3. Click here for more technical information about the TRF0108-SEP.

Decapped and Background TRF0108-SEP (Left) and Device Pin Out (Right)Figure 3-1 Decapped and Background TRF0108-SEP (Left) and Device Pin Out (Right)
TRF0108SEP-EVM Board Top ViewFigure 3-2 TRF0108SEP-EVM Board Top View
TRF0108SEP-EVM, Evaluation Module Board Schematic for SEE TestingFigure 3-3 TRF0108SEP-EVM, Evaluation Module Board Schematic for SEE Testing