SLVK265 March   2026 TRF0108-SEP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1 Overview
  5. 2 Single-Event Effects
  6. 3 Test Device and Evaluation Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 Depth, Range, and LETEFF Calculation
  9. 6 Test Set-Up and Procedures
  10. 7 Single-Event Latch-up (SEL) Results
  11. 8 Single-Event Transients (SET) Results
  12. 9 Event Rate Calculations
  13. 10Summary
  14.   A Total Ionizing Dose from SEE Experiments
  15.   B References

Abstract

This report presents the single-event effects performance of the radiation-tolerant TRF0108-SEP following heavy-ion irradiation. Four production devices were irradiated with heavy ions having an effective linear energy transfer (LETEFF) of up to 56.1MeV-cm2/mg. Single-event latch-up (SEL) testing was conducted on three devices, while single-event transient (SET) characterization was performed on one device. The characterization employed ion fluxes up to 105 ions/cm2-s and fluences up to 107 ions/cm2 at operating temperatures of 25°C for SET testing and 125°C for SEL testing. The results show that the TRF0108-SEP exhibits no single-event latch-up at LETEFF values up to 56.1MeV-cm2/mg and temperatures up to 125°C. Additionally, the single-event transient cross section is analyzed and discussed.