6 Test Setup and Procedures

There were four input supplies used to power the TPS7H6101-SEP which provided PVIN, DVIN, PWM_LI and EN. The PVIN for the device was provided via a Chroma™ 62012 power supply and ranged from 100V to 150V for SEL, SEB/SEGR, and SET testing. The EN of the device was driven by an E36311A power supply and was either forced to 0V or 5V to enable or disable the device. An NI PXIe-5433 Waveform Generator was used to drive PWM_LI to a 100kHz square wave that switched from 0V to 14V. VOUT was set to 28V by adjusting the duty cycle of the square wave accordingly. Input ranges for the different modes and switching frequencies are shown below.

The instrument used to load the TPS7H6101-SEP was a Chroma 63600 e-load that was used in constant resistance (CR) mode. The value of CR was adjusted depending on the type of test. For all SEB and SET testing the CR values were set so that the device can be loaded to 6A, which kept the device running at a temperature of 25°C. During all SEL testing, the CR value was set to achieve a maximum load of 10A.

The primary signal monitored on the EVM was VOUT, which was done using an NI PXIe-5172 set to trigger on a 3% window based on the nominal measured value of VOUT. SW (connection between SW_HS & SW_LS) was monitored as a secondary signal through an NI PXIe-5110 that was set to trigger if the signal exceeded |20%| from the nominal SW duty cycle using a pulse width trigger. During SEB Off testing, all outputs were monitored on a positive edge trigger at 500mV to detect if the device incorrectly turned on while the device was disabled.

All equipment was controlled and monitored using a custom-developed LabVIEW™ program (PXI-RadTest) running on an HP-Z4 desktop computer. The computer communicates with the PXI chassis through an MXI controller and NI PXIe-8381 remote control module.

Table 6-1 shows the connections, limits, and compliance values used during the testing. Figure 6-1 shows a block diagram of the setup used for SEE testing of the TPS7H6101-SEP.

All boards used for SEE testing were fully checked for functionality. Dry runs were also performed to maintain that the test system was stable under all bias and load conditions prior to being taken to the TAMU and KSEE facilities. During the heavy-ion testing, the LabVIEW control program powered up the TPS7H6101-SEP device and set the external sourcing and monitoring functions of the external equipment. After functionality and stability was confirmed, the beam shutter was opened to expose the device to the heavy-ion beam. The shutter remained open until the target fluence was achieved (determined by external detectors and counters). During irradiation, the NI scope cards continuously monitored the signals. When the output exceeded the pre-defined 3% window trigger, |20%| pulse width trigger, or positive edge triggers, a data capture was initiated. No sudden increases in current were observed (outside of normal fluctuations) on any of the test runs and indicated that no SEL or SEB/SEGR events occurred during any of the tests.

Figure 6-1 Block Diagram of the SEE Test Setup for the TPS7H6101-SEP