SBOK111 June   2025 SN55LVTA4-SEP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Device Information
    1. 1.1 Device Details
  5. 2Total Dose Test Setup
    1. 2.1 Test Overview
    2. 2.2 Test Description and Facilities
    3. 2.3 Test Setup Details
      1. 2.3.1 Bias Diagram
    4. 2.4 Test Configuration and Condition
  6. 3TID Characterization Test Results
    1. 3.1 TID Characterization Summary Results
    2. 3.2 Specification Compliance Matrix
  7. 4Reference Documents
  8.   Appendix A: ELDRS Data
  9.   Appendix B: HDR TID Report Data
  10.   Appendix C: LDR TID Report Data

Appendix A: ELDRS Data

This appendix provides the SN55LVTA4-SEP ELDRS summary. The report shows the comparison of each parameter in HDR and LDR.

The ELDRS calculation done using the standard defined in MIL-STD-883J TM 1019.9. Excerpt from this standard is below:

Calculate the ratio of the median Δpara at low dose rate to the median Δpara at high dose rate for each irradiation bias group at each total dose level. If this ratio exceeds 1.5 for any of the most sensitive parameters then the part is considered to be ELDRS susceptible. This test does not apply to parameters which exhibit changes that are within experimental error or values are below the pre-irradiation electrical specification limits at low dose rate at the specification dose.

Based on the standard defined in MIL-STD-883J TM 1019.9, the device is determined to be ELDRS free, as all parameters stayed within the pre-irradiation electrical specification limits at low dose rate at the specification dose of 30krad(Si). Refer to Appendix C for LDR report up to 30krad(Si).