SBOK111 June   2025 SN55LVTA4-SEP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Device Information
    1. 1.1 Device Details
  5. 2Total Dose Test Setup
    1. 2.1 Test Overview
    2. 2.2 Test Description and Facilities
    3. 2.3 Test Setup Details
      1. 2.3.1 Bias Diagram
    4. 2.4 Test Configuration and Condition
  6. 3TID Characterization Test Results
    1. 3.1 TID Characterization Summary Results
    2. 3.2 Specification Compliance Matrix
  7. 4Reference Documents
  8.   Appendix A: ELDRS Data
  9.   Appendix B: HDR TID Report Data
  10.   Appendix C: LDR TID Report Data

2.1 Test Overview

The SN55LVTA4-SEP samples were irradiated at a high dose rate of 169.21rad(Si)/s up to 30krad(Si) and then put through full electrical parametric testing on the production Automated Test Equipment (ATE). Additionally, other SN55LVTA4-SEP samples were irradiated at a low dose rate of 8.21mrad(Si)/s up to 30krad(Si) and then put through full electrical parametric testing on the production Automated Test Equipment (ATE). The samples were functional and passed all electrical parametric tests with readings within data sheet electrical specification limits.