SBOK044B December   2020  – December 2024 TPS7H4010-SEP

 

  1.   1
  2. 1 Abstract
  3.   Trademarks
  4. 2 Introduction
  5. 3 Single-Event Effects (SEE)
  6. 4 Device and Test Board Information
  7. 5 Irradiation Facility and Setup
  8. 6 Depth, Range, and LETEFF Calculation
  9. 7 Test Setup and Procedures
  10. 8 Destructive Single-Event Effects (DSEE)
    1. 8.1 Single-Event Latch-up (SEL) Results
    2. 8.2 Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results
  11. 9 Single-Event Transients (SET)
  12. 10Event Rate Calculations
  13. 11Summary
  14. 12Revision History
  15.   A Total Ionizing Dose from SEE Experiments
  16.   B References

A Total Ionizing Dose from SEE Experiments

The production TPS7H4010-SEP POL is rated to a total ionizing dose (TID) of 20 krad(Si). In the course of the SEE testing, the heavy-ion exposures delivered ≈10 krad(Si) per 107 ions/cm2 run. The cumulative TID exposure over all runs was determined to be between 3 krad(Si) to 20 krad(Si), for each device. All eight production TPS7H4010-SEP devices used in the studies described in this report stayed within specification and were fully-functional after the heavy-ion SEE testing was completed.