SBAK047 March   2025 ADC3664-SEP

 

  1.   1
  2.   2
  3.   Trademarks
  4. 1Introduction
  5. 2Single-Event Effects
  6. 3Irradiation Facility and Setup
  7. 4Depth, Range, and LETEFF Calculation
  8. 5Test Setup and Procedures
  9. 6Destructive Single-Event Effects (DSEE)
    1. 6.1 Single-Event Latch-Up (SEL) Results
  10. 7Single-Event Transients (SET)
    1. 7.1 Single Event Transients
  11. 8Summary
  12. 9References

Trademarks

LabVIEW™ is a trademark of National Instruments.

HP-Z4® is a registered trademark of HP Development Company, L.P..

All trademarks are the property of their respective owners.