SBAK047 March   2025 ADC3664-SEP

 

  1.   1
  2.   2
  3.   Trademarks
  4. 1Introduction
  5. 2Single-Event Effects
  6. 3Irradiation Facility and Setup
  7. 4Depth, Range, and LETEFF Calculation
  8. 5Test Setup and Procedures
  9. 6Destructive Single-Event Effects (DSEE)
    1. 6.1 Single-Event Latch-Up (SEL) Results
  10. 7Single-Event Transients (SET)
    1. 7.1 Single Event Transients
  11. 8Summary
  12. 9References

6.1 Single-Event Latch-Up (SEL) Results

During SEL characterization, the device was heated using forced hot air, maintaining the DUT temperature at 125°C. The die temperature was monitored prior to radiation using a FLIR IR-camera.

The species used for the SEL testing was Silver (109Ag) ion with an angle-of-incedence of 0° for an LETEFF = 79MeV×cm2/ mgm. Flux of 105 ions / cm2× s and a fluence of 107 ions/cm2 were used for the three runs. Run duration to achieve this fluence was less than two minutes. The device was powered up and exposed to the heavy-ions using voltages up to 1.9V, with 1.85V being the maximum recommended operating voltage. No SEL events were observed during all three runs, indicating that the ADC3664-SEP is SEL-free. Table 6-1 shows the SEL test conditions and results. Figure 6-1 shows a typical plot of current versus time for an SEL testing.

Table 6-1 Summary of ADC3664-SEP SEL Test Condition and Results
Run NumberTemperature

Unit #

LETEFF (MeV × cm2/mg)Flux (ions × cm2/s)Fluence (ions × cm2)AVDD/IOVDD (V)

1

125°C

103

51.121.00 × 1051.00 × 1071.9

2

125°C

104

51.121.00 × 1051.50 × 1071.9

14

125°C

127

51.12

1.00 × 105

1.00 × 107

1.9

Current Versus Time for ADC3664-SEP at T = 125°CFigure 6-1 Current Versus Time for ADC3664-SEP at T = 125°C