SBAK047 March   2025 ADC3664-SEP

 

  1.   1
  2.   2
  3.   Trademarks
  4. 1Introduction
  5. 2Single-Event Effects
  6. 3Irradiation Facility and Setup
  7. 4Depth, Range, and LETEFF Calculation
  8. 5Test Setup and Procedures
  9. 6Destructive Single-Event Effects (DSEE)
    1. 6.1 Single-Event Latch-Up (SEL) Results
  10. 7Single-Event Transients (SET)
    1. 7.1 Single Event Transients
  11. 8Summary
  12. 9References

8 Summary

The purpose of this study was to characterize the effect of heavy-ion irradiation on the Single-Event-Effect (SEE) performance of the ADC3664-SEP. Heavy-ions with LETEFF up to 51MeV × cm2/ mg were used for the SEE test campaign. Flux of up to 105ions / cm2× s and fluences up to 107 ions / cm2 per run were used for the characterization. The SEE results demonstrated that the ADC3664-SEP is SEL and SEFI free up to LETEFF = 51MeV × cm2/ mg. The device is characterized for SETs up to LETEFF = 51MeV × cm2/ mg.