ZHCSIQ4B September   2018  – December 2018 OPA828

PRODUCTION DATA.  

  1. 特性
  2. 应用
  3. 说明
    1.     Device Images
      1.      开环增益和相位与频率间的关系
      2.      失调电压漂移
  4. 修订历史记录
  5. Pin Configuration and Functions
    1.     Pin Functions
  6. Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics
    6. 6.6 Typical Characteristics
  7. Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1  Operating Characteristics
      2. 7.3.2  Phase-Reversal Protection
      3. 7.3.3  Electrical Overstress
      4. 7.3.4  MUX Friendly Inputs
      5. 7.3.5  Overload Power Limiter
      6. 7.3.6  Capacitive Load and Stability
      7. 7.3.7  Capacitive Load and Stability
      8. 7.3.8  Settling Time
      9. 7.3.9  Slew Rate
      10. 7.3.10 Full Power Bandwidth
      11. 7.3.11 Small Signal Response
      12. 7.3.12 Thermal Considerations
      13. 7.3.13 Thermal Shutdown
      14. 7.3.14 Low Noise
      15. 7.3.15 Low Offset Voltage Drift
      16. 7.3.16 Overload Recovery
    4. 7.4 Device Functional Modes
      1. 7.4.1 Functional Modes
  8. Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Applications
      1. 8.2.1 Typical Application: SAR ADC Driver
        1. 8.2.1.1 Design Requirements
        2. 8.2.1.2 Detailed Design Procedure
        3. 8.2.1.3 Application Curves
      2. 8.2.2 Typical Application: Low-Pass Filter
        1. 8.2.2.1 Design Requirements
        2. 8.2.2.2 Detailed Design Procedure
        3. 8.2.2.3 Application Curve
  9. Power Supply Recommendations
  10. 10Layout
    1. 10.1 Layout Guidelines
    2. 10.2 Layout Example
  11. 11器件和文档支持
    1. 11.1 器件支持
      1. 11.1.1 开发支持
    2. 11.2 文档支持
      1. 11.2.1 相关文档
    3. 11.3 接收文档更新通知
    4. 11.4 社区资源
    5. 11.5 商标
    6. 11.6 静电放电警告
    7. 11.7 术语表
  12. 12机械、封装和可订购信息

封装选项

机械数据 (封装 | 引脚)
散热焊盘机械数据 (封装 | 引脚)
订购信息

Low Noise

The OPA828 is fabricated on a state-of-the-art SiGe Precision, High-Speed, High-Voltage, BiFET wafer process. Patented wafer processing techniques are used to reduce the noise associated with the JFET gate regions. The OPA828 noise spectral density is shown in Figure 55.

OPA828 Voltage_Noise_New.gifFigure 55. Noise Spectral Density vs Frequency