ZHCS227G June   2011  – April 2024 LP2951-Q1

PRODUCTION DATA  

  1.   1
  2. 1 特性
  3. 2 应用
  4. 3 说明
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 ESD Ratings
    3. 5.3 Recommended Operating Conditions
    4. 5.4 Thermal Information
    5. 5.5 Electrical Characteristics
    6. 5.6 Typical Characteristics
  7. 6 Detailed Description
    1. 6.1 Overview
    2. 6.2 Functional Block Diagram
    3. 6.3 Feature Description
      1. 6.3.1 ERROR Function
      2. 6.3.2 Programming Output Voltage
    4. 6.4 Device Functional Modes
      1. 6.4.1 Shutdown Mode
  8. 7 Application and Implementation
    1. 7.1 Application Information
    2. 7.2 Typical Application
      1. 7.2.1 Design Requirements
        1. 7.2.1.1 Input Capacitor (CIN)
        2. 7.2.1.2 Output Capacitor (COUT)
      2. 7.2.2 Detailed Design Procedure
        1. 7.2.2.1 Capacitance Value
        2. 7.2.2.2 Capacitor Types
        3. 7.2.2.3 CBYPASS: Noise and Stability Improvement
        4. 7.2.2.4 ESR Range
      3. 7.2.3 Application Curves
    3. 7.3 Power Supply Recommendations
    4. 7.4 Layout
      1. 7.4.1 Layout Guidelines
      2. 7.4.2 Layout Example
  9. 8 Device and Documentation Support
    1. 8.1 接收文档更新通知
    2. 8.2 支持资源
    3. 8.3 Trademarks
    4. 8.4 静电放电警告
    5. 8.5 术语表
  10. 9 Revision History
  11. 10Mechanical, Packaging, and Orderable Information

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机械数据 (封装 | 引脚)
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订购信息

5.5 Electrical Characteristics

VIN = VOUT (nominal) + 1 V, IL = 100 μA, CL = 1 μF (5-V versions) or CL = 2.2 μF (3.3-V versions),
8-pin version: FEEDBACK tied to VTAP, OUTPUT tied to SENSE, VSHUTDOWN  ≤ 0.7 V
PARAMETER TEST CONDITIONS TA MIN TYP MAX UNIT
3.3-V VERSION (LP2951-33-Q1)
VOUT Output voltage IL = 100 μA 25°C 3.267 3.3 3.333 V
–40°C to 125°C 3.234 3.3 3.366
5-V VERSION (LP2951-50-Q1)
VOUT Output voltage IL = 100 μA 25°C 4.950 5 5.050 V
–40°C to 125°C 4.900 5 5.100
ALL VOLTAGE OPTIONS
Output voltage temperature coefficient(1)  IL = 100 μA –40°C to 125°C 20 100 ppm/°C
Line regulation(2) VIN = [VOUT(NOM) + 1 V] to 30 V 25°C 0.03 0.2 %/V
–40°C to 125°C 0.4
Load regulation(2) IL = 100 μA to 100 mA 25°C 0.04% 0.2%
–40°C to 125°C 0.3%
VIN – VOUT Dropout voltage(3) IL = 100 μA 25°C 50 80 mV
–40°C to 125°C 150
IL = 100 mA 25°C 380 450
–40°C to 125°C 600
IGND GND current IL = 100 μA 25°C 75 120 μA
–40°C to 125°C 140
IL = 100 mA 25°C 8 12 mA
–40°C to 125°C 14
Dropout ground current VIN = VOUT(NOM) – 0.5 V,
IL = 100 μA		 25°C 110 170 μA
–40°C to 125°C 200
Current limit VOUT = 0 V 25°C 160 200 mA
–40°C to 125°C 220
Thermal regulation(4)  IL = 100 μA 25°C 0.05 0.2 %/W
Output noise (RMS),
10 Hz to 100 kHz		 CL = 1 μF (5 V only) 25°C 430 μV
CL = 200 μF 160
LP2951-50-Q1: CL = 3.3 μF,
CBypass = 0.01 μF between pins 1 and 7		 100
Reference voltage(6) VOUT = VREF to (VIN – 1 V),
VIN = 2.3 V to 30 V,
IL = 100 μA to 100 mA		 –40°C to 125°C 1.200 1.272 V
Reference voltage temperature coefficient(1)   25°C 20 ppm/°C
ERROR COMPARATOR
Output leakage current VOUT = 30 V 25°C 0.01 1 μA
–40°C to 125°C 2
Output low voltage VIN = VOUT(NOM) – 0.5 V,
IOL = 400 μA		 25°C 150 250 mV
–40°C to 125°C 400
Upper threshold voltage (ERROR output high)(5)   25°C 40 60 mV
–40°C to 125°C 25
Lower threshold voltage (ERROR output low)(5)   25°C 75 95 mV
–40°C to 125°C 140
Hysteresis(5)   25°C 15 mV
SHUTDOWN INPUT
Input logic voltage Low (regulator ON) –40°C to 125°C 0.7 V
High (regulator OFF) 2
SHUTDOWN input current VTAP = 2.4 V 25°C 30 50 μA
–40°C to 125°C 100
VTAP = 30 V 25°C 450 600
–40°C to 125°C 750
Regulator output current
in shutdown		 VSHUTDOWN ≥ 2 V,
VIN ≤ 30 V, VOUT = 0,
FEEDBACK tied to VTAP		 25°C 3 10 μA
–40°C to 125°C 20
(1) Output or reference voltage temperature coefficient is defined as the worst-case voltage change divided by the total temperature range.
(2) Regulation is measured at constant junction temperature, using pulse testing with a low duty cycle. Changes in output voltage resulting from heating effects are covered under the specification for thermal regulation.
(3) Dropout voltage is defined as the input-to-output differential at which the output voltage drops 100 mV, below the value measured at 1-V differential. The minimum input supply voltage of 2 V (2.3 V over temperature) must be observed.
(4) Thermal regulation is defined as the change in output voltage at a time (T) after a change in power dissipation is applied, excluding load or line regulation effects. Specifications are for a 50-mA load pulse at VIN = 30 V, VOUT = 5 V (1.25-W pulse) for t = 10 ms.
(5) Comparator thresholds are expressed in terms of a voltage differential equal to the nominal reference voltage (measured at VIN – VOUT = 1 V) minus FEEDBACK terminal voltage. To express these thresholds in terms of output voltage change, multiply by the error amplifier gain = VOUT / VREF = (R1 + R2) / R2. For example, at a programmed output voltage of 5 V, the ERROR output is specified to go low when the output drops by 95 mV × 5 V / 1.235 V = 384 mV. Thresholds remain constant as a percentage of VOUT (as VOUT is varied), with the low-output warning occurring at 6% below nominal (typical) and 7.7% (maximum).
(6) For the LP2951-50QDR in the SOIC package, VREF is tested at VIN = 6 V and IOUT=100 μA.