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TPS7H1121-SP

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耐辐射、QMLV 和 QMLP、2.25V 至 14V 输入、2A 低压降 (LDO) 稳压器

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TPS7H1121-SP

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产品详情

Output options Adjustable Output Iout (max) (A) 2 Vin (max) (V) 14 Vin (min) (V) 2.25 Vout (max) (V) 13.2 Vout (min) (V) 0.6 Fixed output options (V) 0 Rating Space Noise (µVrms) 4 PSRR at 100 KHz (dB) 45 Iq (typ) (mA) 10 Thermal resistance θJA (°C/W) 30.5 Load capacitance (min) (µF) 6.8 Regulated outputs (#) 1 Features Adjustable current limit, Enable, Power good, Soft start Accuracy (%) 1.5 Dropout voltage (Vdo) (typ) (mV) 400 Operating temperature range (°C) -55 to 125 Radiation, SEL (MeV·cm2/mg) 75 Radiation, TID (typ) (krad) 100
Output options Adjustable Output Iout (max) (A) 2 Vin (max) (V) 14 Vin (min) (V) 2.25 Vout (max) (V) 13.2 Vout (min) (V) 0.6 Fixed output options (V) 0 Rating Space Noise (µVrms) 4 PSRR at 100 KHz (dB) 45 Iq (typ) (mA) 10 Thermal resistance θJA (°C/W) 30.5 Load capacitance (min) (µF) 6.8 Regulated outputs (#) 1 Features Adjustable current limit, Enable, Power good, Soft start Accuracy (%) 1.5 Dropout voltage (Vdo) (typ) (mV) 400 Operating temperature range (°C) -55 to 125 Radiation, SEL (MeV·cm2/mg) 75 Radiation, TID (typ) (krad) 100
CFP (HFT) 22 60.221856 mm² 6.211 x 9.696
  • Total Ionizing Dose radiation characterized:

    • Radiation hardness assurance (RHA) availability of 100krad(Si) or 50krad(Si)

  • Single-Event Effects (SEE) Characterized
    • Single-event latch-up (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune to linear energy transfer (LET) = 75MeV-cm2/mg
    • Single-event functional interrupt (SEFI) characterized to LET = 75MeV-cm2/mg
    • Single-event transient (SET) characterized to LET = 75MeV-cm2/mg
  • Wide VIN range: 2.25V to 14V
  • 2A maximum output current
  • ±1.5% accuracy VIN > 3V over load, and temperature
  • ±1.8% accuracy VIN < 3V over load, and temperature
  • Soft start (SS) control through an external capacitor
  • Open-drain power good (PG) output for power sequencing
  • Programmable current limit through an external resistor (CL)
  • Optional external control loop compensation utilizing the STAB pin
  • Excellent load and line transient response
  • Plastic packages out gas tested per ASTM E595
  • Military (–55°C to 125°C) temperature range
  • Total Ionizing Dose radiation characterized:

    • Radiation hardness assurance (RHA) availability of 100krad(Si) or 50krad(Si)

  • Single-Event Effects (SEE) Characterized
    • Single-event latch-up (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune to linear energy transfer (LET) = 75MeV-cm2/mg
    • Single-event functional interrupt (SEFI) characterized to LET = 75MeV-cm2/mg
    • Single-event transient (SET) characterized to LET = 75MeV-cm2/mg
  • Wide VIN range: 2.25V to 14V
  • 2A maximum output current
  • ±1.5% accuracy VIN > 3V over load, and temperature
  • ±1.8% accuracy VIN < 3V over load, and temperature
  • Soft start (SS) control through an external capacitor
  • Open-drain power good (PG) output for power sequencing
  • Programmable current limit through an external resistor (CL)
  • Optional external control loop compensation utilizing the STAB pin
  • Excellent load and line transient response
  • Plastic packages out gas tested per ASTM E595
  • Military (–55°C to 125°C) temperature range

The TPS7H1121 is a radiation-hardened, low dropout linear regulator (LDO) which operates over a wide input voltage range and is optimized for powering devices in a space environment. It is capable of sourcing up to 2A over a 2.25V to 14V input.

The device offers excellent stability and features a programmable current limit with a wide adjustment range. To support the complex power requirements of FPGAs, DSPs, and microcontrollers, the TPS7H1121 provides enable on and off functionality, programmable soft start, and a power good open-drain output.

The TPS7H1121 is a radiation-hardened, low dropout linear regulator (LDO) which operates over a wide input voltage range and is optimized for powering devices in a space environment. It is capable of sourcing up to 2A over a 2.25V to 14V input.

The device offers excellent stability and features a programmable current limit with a wide adjustment range. To support the complex power requirements of FPGAs, DSPs, and microcontrollers, the TPS7H1121 provides enable on and off functionality, programmable soft start, and a power good open-drain output.
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类型 标题 下载最新的英语版本 日期
* 数据表 TPS7H1121-SP 2.25V to 14V Input, 2A, Radiation Hardened Low Dropout (LDO) Linear Regulator 数据表 (Rev. A) PDF | HTML 2024年 9月 24日
* 辐射与可靠性报告 TPS7H1121-SP Neutron Displacement Damage (NDD) Characterization Report PDF | HTML 2024年 9月 19日
* 辐射与可靠性报告 TPS7H1121-SP Total Ionizing Dose (TID) Radiation Report PDF | HTML 2024年 9月 19日
* 辐射与可靠性报告 TPS7H1121-SP Single-Event Effects (SEE) PDF | HTML 2024年 9月 18日
应用简报 经 DLA 批准的 QML 产品优化 (Rev. B) PDF | HTML 英语版 (Rev.B) PDF | HTML 2024年 10月 28日
EVM 用户指南 TPS7H1121EVM-CVAL 评估模块 (EVM) (Rev. A) PDF | HTML 英语版 (Rev.A) PDF | HTML 2024年 7月 1日
证书 TPS7H1121EVM-CVAL EU Declaration of Conformity (DoC) 2024年 4月 5日
选择指南 TI Space Products (Rev. J) 2024年 2月 12日
更多文献资料 TI Engineering Evaluation Units vs. MIL-PRF-38535 QML Class V Processing (Rev. A) 2023年 8月 31日
应用手册 QML flow, its importance, and obtaining lot information (Rev. C) 2023年 8月 30日
应用手册 DLA Standard Microcircuit Drawings (SMD) and JAN Part Numbers Primer 2020年 8月 21日
应用手册 Hermetic Package Reflow Profiles, Termination Finishes, and Lead Trim and Form PDF | HTML 2020年 5月 18日
电子书 电子产品辐射手册 (Rev. A) 2019年 5月 21日

设计和开发

如需其他信息或资源，请点击以下任一标题进入详情页面查看（如有）。

评估板

TPS7H1121EVM-CVAL — TPS7H1121-SP 评估模块

TPS7H1121EVM-CVAL 演示了单个 TPS7H1121-SP LDO 稳压器的运行。该板提供可用于组装额外元件的空间，以便对定制配置进行测试；它还提供了测试点和 SMA 连接器，以便轻松进行性能验证。
用户指南: PDF | HTML
英语版 (Rev.A): PDF | HTML
TI.com 上无现货
仿真模型

TPS7H1121-SP PSpice Model

SLVME97.ZIP (36 KB) - PSpice Model
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封装 引脚 CAD 符号、封装和 3D 模型
CFP (HFT) 22 Ultra Librarian
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包含信息：
  • RoHS
  • REACH
  • 器件标识
  • 引脚镀层/焊球材料
  • MSL 等级/回流焊峰值温度
  • MTBF/时基故障估算
  • 材料成分
  • 鉴定摘要
  • 持续可靠性监测
包含信息：
  • 制造厂地点
  • 封装厂地点

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