STDA039 July   2026 F28377D-SEP , INA901-SP , SN54SLC8T245-SEP , TPS7A4501-SP , TPS7H1121-SEP , TPS7H1121-SP , TPS7H5020-SEP , TPS7H5020-SP , TPS7H6101-SEP

 

  1.   1
  2.   Abstract
  3. 1Introduction
  4. 2Space ‑ Electronics Design Landscape
  5. 3Importance of a Single Controlled Baseline
  6. 4The Steps to Take to Upscreen a COTS Device
    1. 4.1 Step 1 – Identifying the Candidates
    2. 4.2 Step 2 – Preparation for Single‑Event Effect (SEE) Testing (Opening)
    3. 4.3 Step 3 – Single‑Event Effect (SEE) Testing
    4. 4.4 Step 4 – Running TID Tests and Evaluating Radiation Lifetime
  7. 5Lead‑Time and Yield Responsibility
  8. 6Summary
  9. 7References

Summary

Qualifying semiconductor products for spaceflight is a highly complex undertaking. Leverage the expertise of your parts agency and semiconductor manufacturers when making decisions, as up‑screened components and catalogued space‑grade parts can complement each other effectively.

When strong technical or commercial drivers necessitate up‑screening, be mindful of the associated risks and adopt a proactive stance:

  • Monitor parameter drifts, yield, and the timely evaluation of additional devices or even complete lots.
  • Recognize that quality assurance responsibility rests with you.
  • Strive for the most efficient up-screening approach.
  • Engage in dialogue with EEE experts, such as the TESAT Parts Agency, for component services to tailor a procurement strategy that aligns your specific program and quality needs.

Whenever an appropriate space‑grade device exists, that device is usually the preferred choice. Space‑grade parts offer several advantages:

  • Proven, ground-up quality assurance.
  • Reorderable and reusable for future designs.
  • Long term process stability that builds flight heritage over time.

If cost is a concern—especially for higher volumes (1,000 + units)—engage in dialogue with suppliers such as Texas Instruments to explore pricing options.

Remember: Quality cannot be tested into a part (Staerk, 2000).