SPRZ292S December   2008  – November 2020 TMS320F28020 , TMS320F280200 , TMS320F28021 , TMS320F28022 , TMS320F28022-Q1 , TMS320F280220 , TMS320F28023 , TMS320F28023-Q1 , TMS320F280230 , TMS320F28026 , TMS320F28026-Q1 , TMS320F28026F , TMS320F28027 , TMS320F28027-Q1 , TMS320F280270 , TMS320F28027F , TMS320F28027F-Q1

 

  1.   TMS320F2802x, TMS320F2802xx MCUs Silicon Revisions B, A, 0
  2. 1Introduction
  3. 2Device and Development Support Tool Nomenclature
  4. 3Device Markings
  5. 4Usage Notes and Known Design Exceptions to Functional Specifications
    1. 4.1 Usage Notes
      1. 4.1.1 PIE: Spurious Nested Interrupt After Back-to-Back PIEACK Write and Manual CPU Interrupt Mask Clear Usage Note
      2. 4.1.2 Flash: MAX "Program Time” and “Erase Time” in Revision O of the TMS320F2802x Microcontrollers Data Manual are only Applicable for Devices Manufactured After October 2020
    2. 4.2 Known Design Exceptions to Functional Specifications
      1.      Advisory to Silicon Variant / Revision Map
      2.      Advisory
      3.      Advisory
      4.      Advisory
      5.      Advisory
      6.      Advisory
      7.      Advisory
      8.      Advisory
      9.      Advisory
      10.      Advisory
      11.      Advisory
      12.      Advisory
      13.      Advisory
      14.      Advisory
      15.      Advisory
      16.      Advisory
      17.      Advisory
      18.      Advisory
      19.      Advisory
      20.      Advisory
      21.      Advisory
      22.      Advisory
  6. 5Documentation Support
  7. 6Trademarks
  8. 7Revision History

Advisory

ADC: Temperature Sensor Minimum Sample Window Requirement

Revision(s) Affected

0, A, B

Details

If the minimum sample window is used (6 ADC clocks at 60 MHz, 116.67 ns), the result of a temperature sensor conversion can have a large error, making it unreliable for the system.

Workaround(s)

  1. If double-sampling of the temperature sensor is used to avoid the corrupted first sample issue, the temperature sensor result is valid. This is equivalent to giving the S/H circuit adequate time to charge.
  2. In all other conditions, the sample-and-hold window used to sample the temperature sensor should not be less than 550 ns.