SPRZ193T January   2003  – December 2023 SM320F2812 , SM320F2812-EP , SMJ320F2812 , TMS320F2810 , TMS320F2810-Q1 , TMS320F2811 , TMS320F2811-Q1 , TMS320F2812 , TMS320F2812-Q1

 

  1.   1
  2. 1Introduction
  3. 2Device and Development Tool Support Nomenclature
  4. 3Device Markings
  5. 4Usage Notes and Known Design Exceptions to Functional Specifications
    1. 4.1 Usage Notes
      1. 4.1.1 PIE: Spurious Nested Interrupt After Back-to-Back PIEACK Write and Manual CPU Interrupt Mask Clear Usage Note
  6. 5Known Design Exceptions to Functional Specifications
    1.     Advisory
    2.     Advisory
    3.     Advisory
    4.     Advisory
    5.     Advisory
    6.     Advisory
    7.     Advisory
    8.     Advisory
    9.     Advisory
    10.     Advisory
    11.     Advisory
    12.     Advisory
    13.     Advisory
    14.     Advisory
    15.     Advisory
    16.     Advisory
    17.     Advisory
    18.     Advisory
    19.     Advisory
    20.     Advisory
    21.     Advisory
    22.     Advisory
    23.     Advisory
    24.     Advisory
    25.     Advisory
    26.     Advisory
    27.     Advisory
    28.     Advisory
    29.     Advisory
    30.     Advisory
    31.     Advisory
  7. 6Documentation Support
  8. 7Trademarks
  9. 8Revision History

Advisory

ADC: Device Has Higher Non-Linearity Than the Design Goal of 2 LSBs

Revision(s) Affected

0 and A

Details

Based on the current data obtained on all channels, some channels show non-linearity as high as 12 LSBs in the mid-scale range. That is, the mid-range conversions will be off by about 12 LSB counts.

Workaround(s)

This issue is corrected in the next revision of the silicon. The following option could be used to correct for INL errors only for the TMX Revision A silicon.

The INL issue is across all channels. Use the ADC results only for 9-bit data accuracy on this revision of the silicon and ignore the rest of the bits. This will mitigate the INL effect in the application provided the algorithm can tolerate 9-bit accuracy.

Note:

The data provided are typical values only. These values are obtained from bench characterization at room temperature on a few devices.

TMX samples are not fully screened for all ADC parameters. If there are devices that have worse performance than suggested issues/values, it is recommended that the part be replaced.