SLVUBD4B January   2018  – October 2020 TPS27SA08

 

  1.   Trademarks
  2. 1Introduction
    1. 1.1 Descriptions
    2. 1.2 Applications
    3. 1.3 Features
  3. 2HSS-MOTHERBOARDEVM Schematic
  4. 3Connections Descriptions
    1. 3.1 Connectors and Test Points
    2. 3.2 Jumpers
  5. 4HSS-MOTHERBOARDEVM EVM Assembly Drawings and Layout
  6. 5Current Limit
  7. 6Current Sense
  8. 7Transient Protection
  9. 8Soldering Down U2
  10. 9Bill of Materials
  11.   Revision History

3.1 Connectors and Test Points

Table 3-1 lists the EVM connector and test point descriptions.

Table 3-1 Connector and Test Point Descriptions
Connectors and Test Points Descriptions
J23 High-current input terminal for VBB.
J26 High-current output for VOUT1.
J27 High-current output for VOUT2.
J28 High-current output for paralleling 2 channels into single channel VOUT.
J25 High-current input terminal for GND.
Vbb_Sense (TP11) Test point used to measure VBB Votlage.
Vout1_Sense (TP10) Test point to measure VOUT1 Voltage.
Vout2_Sense (TP12) Test point to measure VOUT2 Voltage.
EN1 (TP3) Test point used to apply power to EN1, only use when J9 is not connected to 5 V or GND.
EN2 (TP7) Test point used to apply power to EN2, only use when J13 is not connected to 5 V or GND. Only for 2 channel devices.
DIA_EN (TP4) Test point used to apply power to DIA_EN, only use when J10 is not connected to 5 V or GND.
SEL1 (TP5) Test point used to apply power to SEL1, only use when J12 is not connected to 5 V or GND.
SEL2 (TP6) Test point used to apply power to SEL2, only use when J11 is not connected to 5 V or GND.
LATCH (TP2) Test point used to apply power to LATCH, only use when J8 is not connected to 5 V or GND.
SNS (TP1) Test point used to measure SNS.
TP17 Connects to ISNS1 on the daughtercard.
TP18 Connects to ISNS2 on the daughtercard. Only for 2 channel devices.
TP8 5-V external input terminal for 5-V EVM.
TP13, TP14, TP15, TP16 This is a direct connection to the GND plane of the EVM.