SLVK326 May   2026 ADS1278QML-SP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Introduction
  5. 2Single-Event Effects (SEE)
  6. 3Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5LETEFF and Range Calculation
  9. 6Test Setup and Procedures
  10. 7Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-up (SEL) Results
  11. 8Summary
  12. 9References

Test Setup and Procedures

There were four supplies used to power the ADS1278QML-SP which provided AIN, AVDD, DVDD, and IOVDD.

Device output was continuously monitored to confirm device functionality through USB connection and external GUI.

Power supply equipment was controlled and monitored using a custom-developed LabVIEW™ program (PXI-RadTest) running on a HP-Z4 desktop computer. The computer communicates with the PXI chassis via an MXI controller and NI PXIe-8381 remote control module.

Table 6-1 shows the connections, limits, and compliance values used during the testing. Figure 6-1 shows a block diagram of the setup used for SEE testing of the ADS1278QML-SP.

Table 6-1 Equipment Settings and Parameters Used During the SEE Testing of the ADS1278QML-SP
PIN NAME EQUIPMENT USED CAPABILITY COMPLIANCE RANGE OF VALUES USED
AIN

NI-PXIe 4139

(CH # 1)

±60V,

3A

3A5V
AVDDE36311A (CH # 1)5V,5A0.1A5V
DVDDE36311A (CH # 2)5V,5A0.1A1.95V
IOVDDE36311B (CH # 1)5V,5A0.1A3.6V

All boards used for SEE testing were fully checked for functionality. Dry runs were also performed to maintain that the test system was stable under all bias and load conditions prior to being taken to the test facility. During the heavy-ion testing, the LabVIEW control program powered up the ADS1278QML-SP device and set the sourcing functions of the external equipment. After functionality and stability was confirmed, the beam shutter was opened to expose the device to the heavy-ion beam. The shutter remained open until the target fluence was achieved (determined by external detectors and counters). During irradiation, the external GUI continuously monitored the signals. No sudden increases in current were observed (outside of normal fluctuations) on any of the test runs and indicated that no SEL events occurred during any of the tests.

 Block Diagram of the SEE Test Setup for the ADS1278QML-SPFigure 6-1 Block Diagram of the SEE Test Setup for the ADS1278QML-SP