SLVK326 May   2026 ADS1278QML-SP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Introduction
  5. 2Single-Event Effects (SEE)
  6. 3Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5LETEFF and Range Calculation
  9. 6Test Setup and Procedures
  10. 7Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-up (SEL) Results
  11. 8Summary
  12. 9References

7.1 Single-Event Latch-up (SEL) Results

During the SEL testing the device was heated to 125°C by using a closed-Loop PID controlled heat gun (MISTRAL 6 System (120V, 2400W). The temperature of the die was constantly monitored during testing at TAMU through an IR camera integrated into the control loop to create closed-loop temperature control.

The species used for SEL testing was 109Ag at 15 MeV/nucleon (for more details refer to Table 5-1. Ion LETEFF and range in Silicon ). Flux of approximately 1 × 105 ions×cm2/s and a fluence of approximately 1 × 107 ions/cm2 per run was used. Run duration to achieve this fluence was approximately two minutes. The three devices were powered up and exposed to the heavy-ions using the maximum recommended operating voltages of AVDD = 5V, DVDD = 1.95V, and IOVDD = 3.6V. No SEL events were observed, indicating that the ADS1278QML-SP is SEL-free up to 51 MeV×cm2/mg. Table 7-1 shows the SEL test conditions and results. Figures 7-1, 7-2, and 7-3 show plots of the current vs time for run # 14.

Table 7-1 Summary of ADS1278QML-SP SEL Test Condition and Results
Run # Unit # Facility Ion LETEFF (MeV·c m2/mg)

Flux

(ions·cm2/ mg)

 Fluence (# ions) AIN AVDD DVDD IOVDD

SEL (#

Events)

135TAMU109Ag511.0 x 1051 x 107551.953.60
145TAMU109Ag511.0 x 1051 x 107551.953.60
155TAMU109Ag511.0 x 1051 x 107551.953.60
234TAMU109Ag511.0 x 1051 x 107551.953.60
244TAMU109Ag511.0 x 1051 x 107551.953.60
254TAMU109Ag511.0 x 1051 x 107551.953.60
82TAMU109Ag511.0 x 1051 x 107551.953.60
92TAMU109Ag511.0 x 1051 x 107551.953.60
102TAMU109Ag511.0 x 1051 x 107551.953.60
AVDD Current versus Time for Run #14 of the ADS1278QML-SP at T = 125°Figure 7-1 AVDD Current versus Time for Run #14 of the ADS1278QML-SP at T = 125°
DVDD Current versus Time for Run # 23 of the ADS1278QML-SP at T = 125°Figure 7-2 DVDD Current versus Time for Run # 23 of the ADS1278QML-SP at T = 125°
IOVDD Current versus Time for Run #23 of the ADS1278QML-SP at T = 125°Figure 7-3 IOVDD Current versus Time for Run #23 of the ADS1278QML-SP at T = 125°