SLVK326 May   2026 ADS1278QML-SP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Introduction
  5. 2Single-Event Effects (SEE)
  6. 3Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5LETEFF and Range Calculation
  9. 6Test Setup and Procedures
  10. 7Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-up (SEL) Results
  11. 8Summary
  12. 9References

8 Summary

The purpose of this study was to characterize the effect of heavy-ion irradiation on the single-event effect (SEE) performance of the ADS1278QML-SP 24-bit, delta-sigma analog-to-digital converter (ADC). Heavy-ions with LETEFF = 51 MeV×cm2/mg were used for the SEE characterization campaign. Flux of ≈104 to 105 ions/cm2 ×s and fluences of ≈106 to 107 ions/cm2 per run were used for the characterization. The SEE results demonstrated that the ADS1278QML-SP is free of destructive SEL at LETEFF = 51 MeV×cm2/mg and across the full electrical specifications.