3 Device and Test Board Information

The TPS7H401x-SP is packaged in a 44-pin plastic package as shown in Figure 3-1. The TPS7H401x-SP evaluation module (EVM) was used to evaluate the performance and characteristics of the TPS7H401x-SP under heavy ion radiation. The TPS7H4012EVM is shown in Figure 3-2 and its schematic is shown in Figure 3-4. The TPS7H4013EVM is shown in Figure 3-3 and its schematic is shown in Figure 3-5. The TPS7H401xEVM was used for this test campaign with TPS7H410x-SP units populated onto U1.

Figure 3-1 Photograph of Delidded TPS7H401x-SP (Left) and Pinout Diagram (Right)

The package was delidded to reveal the die face for all heavy-ion testing.

Figure 3-2 TPS7H4012-SP EVM Top View.

Jumper on J6 was configured in the 2-3 position for all testing

Figure 3-3 TPS7H4013-SP EVM Top View. Jumper on J6 was configured in the 2-3 position for all testing

Figure 3-4 TPS7H4012EVM Schematics

Figure 3-5 TPS7H4013EVM Schematics