8 Single-Event Transients (SET)

SETs are defined as heavy-ion-induced transients upsets on the VOUT, SS_TR, or PWRGD of the TPS7H401x-SP.

Testing was performed at room temperature (no external temperature control applied). The heavy-ion species used for the SET testing was Homium (¹⁶⁵Ho) for an LET_EFF = 75 MeV×cm²/mg, for more details refer to Table 5-1. Flux of ≈1 × 10⁵ ions/cm²/s and a fluence of 1×10⁷ ions/cm², per run were used for the SET characterization discussed on this chapter. Over the course of testing eight devices, not a single transient or SEFI was recorded on any of the monitored signals during the V_IN = 12V case indicating that the TPS7H401x-SP is SET/SEFI free up to LET_EFF = 75 MeV×cm²/mg at V_IN = 12V.

During the V_IN = 5V case, two TPS7H4012-SP and two TPS7H4013-SP units that were tested under this condition recorded normal transients greater than 3%. These transients are listed and characterized in tables and figures below. All transients recovered on their own without the need for external intervention and all magnitudes and recovery times are shown in the histogram plots below. Please note that both the TPS7H4012EVM and TPS7H4013EVM have less output capacitance than the original TPS7H4011EVM-CVAL. Please refer to the EVM schematics shown in the Device and Test Board section and the SEE test block diagrams in the Test Setup and Procedures section, as well as the TPS7H4011-SP device page to compare the output capacitances and see the delta in output transient performance under the diferent bias conditions.

Waveform size, sample rate, trigger type, value, and signal for all scopes used is presented on Table 8-1.