TLV4H290-SEP HDR exposure was performed on biased and unbiased devices in a Co60 gamma cell at TI facilities. The un-attenuated dose rate of this cell is 265rad(Si)/s.

After exposure, the devices were packed in dry ice (per MIL-STD-883 Method 1019.9 section 3.10) and returned to TI Santa Clara for a full post radiation electrical evaluation using Texas Instruments ATE. ATE guard band test limits are set within data sheet electrical limits to maintain a minimum Cpk and test error margin based on initial qualification and characterization data. Post radiation measurements were taken within 30 minutes of removal of the devices from the dry ice container. The devices were allowed to reach room temperature prior to electrical post radiation measurements. See Appendix 1 for post HDR radiation electrical measurements.

After electrical test, functional units exhibiting parametric drift were placed in extended room temperature anneal testing according to MIL-STD-883, Test Method 1019.9, section 3.11.2. Electrical measurements were taken at 72 hours after the annealing procedure. Calculated effective dose rates for each dosage level can be seen in Table 4-1 below. See Appendix 2 for electrical measurement data during room temperature anneal testing.