SLOK019 December 2024 TLV4H290-SEP
5.1 Single Event Latchup (SEL) Results
During SEL characterization, the device was heated using forced hot air, maintaining the IC temperature at 125°C. The temperature was monitored by means of a thermal camera. The species used for the SEL testing was a Xenon (129Xe) ion with an angle-of-incidence of 0° for an LETEFF = 50.5 MeV-cm2 /mg. A flux of approximately 105 ions/cm2 -s and a fluence of approximately 107 ions were used each run. The V+ supply voltage is supplied externally on board at recommended maximum voltage setting of 5.5V. Run duration to achieve this fluence was approximately less than 2 minutes. Two devices were tested (one at output low and the other at output high condition) where each device had a total of two runs. Supply current also includes output pullup-current.
| RUN # | DUT | Output Condition | DISTANCE (mm) | TEMPERATURE (°C) | ION | ANGLE | FLUX (ions·cm2/mg) | FLUENCE (# ions) | LETEFF (MeV.cm2/mg) |
|---|---|---|---|---|---|---|---|---|---|
50 | 2 | Low | 40 | 125 | 129Xe | 0 | 1.02E+05 | 1.00 E+07 | 50.5 |
51 | 2 | Low | 40 | 125 | 129Xe | 0 | 1.02E+05 | 1.00
E+07 | 50.5 |
52 | 3 | High | 40 | 125 | 129Xe | 0 | 1.01E+05 | 1.00
E+07 | 50.5 |
53 | 3 | High | 40 | 125 | 129Xe | 0 | 1.00E+05 | 1.00 E+07 | 50.5 |
No SEL events were observed, indicating that the TLV4H290-SEP is SEL-immune at LETEFF = 43MeV-cm2/mg and T = 125°C. Using the MFTF method described and combining (or summing) the fluences of the two runs at 125°C (2 × 107), the upper-bound cross-section (using a 95% confidence level) is calculated as:
σSEL ≤ 1.84 × 10–7 cm2 for LETEFF = 43MeV-cm2/mg and T = 125°C.
Figure 5-1 Run #50: DUT2 Supply Current Versus
Time
Figure 5-2 Run #51: DUT2 Supply Current Versus Time
Figure 5-3 Run #52: DUT3 Supply Current Versus Time
Figure 5-4 Run #53: DUT3 Supply Current Versus
Time