SLAA996A June   2021  – June 2021 TPA6304-Q1

 

  1.   Trademarks
  2. 1Introduction
  3. 2Understanding the Thermal Flow
  4. 3Understanding the Test and System Conditions
    1. 3.1 Device Efficiency
    2. 3.2 Test Signals
      1. 3.2.1 Sinusoidal Signal
      2. 3.2.2 Pink Noise
      3. 3.2.3 Music File
    3. 3.3 Ambient Temperature
    4. 3.4 Junction Temperature
    5. 3.5 Thermal Interface Material and Heatsink
  5. 4Calculating Dynamic Thermal Dissipation
  6. 5Designing a Realistic Thermal Test
  7. 6Thermal Tests
    1. 6.1 Test Setup
    2. 6.2 5W 1kHz Sine Wave Test
      1. 6.2.1 Calculations
      2. 6.2.2 Dynamic Calculation Results
      3. 6.2.3 Tested Results
      4. 6.2.4 Summary of Results
    3. 6.3 10W 1kHz Sine Wave Test
      1. 6.3.1 Calculations
      2. 6.3.2 Dynamic Calculation Results
      3. 6.3.3 Tested Results
      4. 6.3.4 Summary of Results
    4. 6.4 5W Pink Noise Test
      1. 6.4.1 Calculations
      2. 6.4.2 Dynamic Calculation Results
      3. 6.4.3 Tested Results
      4. 6.4.4 Summary of Results
    5. 6.5 10W 1kHz 85°C Test
      1. 6.5.1 Calculations
      2. 6.5.2 Dynamic Calculation Results
      3. 6.5.3 Tested Results
      4. 6.5.4 Summary of Results
  8. 7Overall Summary
  9. 8References
  10. 9Revision History

Test Setup

GUID-20210330-CA0I-P6ZD-ZNZN-7NXB5RJJGQQ5-low.gif Figure 6-1 Block Diagram of Setup

For each thermal test, the TPA6304Q1EVM was used with the default heatsink (θHA = 2.09°C/W) and Arctic Silver 5 (θCH = 0.19°C/W) is used as the thermal interface.

There were several modifications done to the TPA6304Q1EVM before testing. Referencing to Figure 6-2, Figure 6-3, and Figure 6-4 the LM1086IT-3.3 was bypassed by removing L11 and plugging in a separate 3.3V supplies. The XMOS controller was disabled using S2 and removing the jumper on J3. This was done to remove any additional heat that would have been generated from those devices and could distort the thermal measurements of the audio amplifier.

GUID-20210421-CA0I-WW7B-FGWL-8DZG3JCCLFR2-low.gif Figure 6-2 TPA6304Q1EVM Schematic (Page 1)
GUID-20210421-CA0I-WRZV-MG9K-8P1RGZLP4LSX-low.gif Figure 6-3 TPA6304Q1EVM Schematic (Page 2)
GUID-20210421-CA0I-P4W7-QWKR-2L8D8V2M5T8B-low.gif Figure 6-4 TPA6304Q1EVM Schematic (Page 3)

To monitor the temperature of the device case, a hole was drilled in the center of the heatsink large enough to place a thermocouple sensor, as seen in Figure 6-5. This thermocouple checks the temperature of the case's thermal pad over the course of the test and determines when the device reaches thermal equilibrium.

GUID-20210401-CA0I-SQZ2-XJQB-36BLRNB3CH6P-low.png Figure 6-5 Cross-Sectional View of the System

The test will run until the system reaches thermal equilibrium. Thermal equilibrium was defined in these tests as a temperature change of less than 1°C after 10 minutes.

To ensure that the ambient temperature on the heatsink remained consistent, the test was taken in a thermal chamber.