SFFS422 May   2022

 

  1.   Trademarks
  2.   2
  3. 1Scope
  4. 2Related Documents
  5. 3Related Standards and Acronyms
  6. 4Concept Overview
    1. 4.1 System Block Diagram
    2. 4.2 System Specifications
    3. 4.3 Conditions of use: Assumptions
      1. 4.3.1 Generic Assumptions
      2. 4.3.2 Specific Assumptions
    4. 4.4 Safe Torque Off Implementation
      1. 4.4.1 Subsystem Elements
      2. 4.4.2 STO Safe Subsystem States and Timing Diagram
      3. 4.4.3 STO_1 Subsystem
      4. 4.4.4 STO_2 Subsystem
      5. 4.4.5 MCU (SIL 1) Diagnostic Coverage
      6. 4.4.6 STO_FB Subsystem
      7. 4.4.7 Information on ICs
        1. 4.4.7.1 Isolated 24-V Input Receiver
        2. 4.4.7.2 Load Switch: TPS22919
        3. 4.4.7.3 High-Side Switch: TPS27S100
        4. 4.4.7.4 Isolated Gate Driver: ISO5852S (ISO5452)
    5. 4.5 Safe State
  7. 5Concept FMEA
    1. 5.1 System FMEA
  8. 6References

STO_FB Subsystem

The STO_FB signal is an active low signal and indicates the drive state. A high signal (logic level 1) indicates normal drive operation, while a low signal (logic state 0) indicates the drive is in the safe state. The schematic is shown in Figure 4-7. The output signals STO_1_FB and STO_2_FB of the corresponding STO_1 and STO_2 safe subsystems are logically combined to a single active low feedback signal STO_FB through an isolated 24-V digital output. The corresponding logic states are shown in Table 4-4.

GUID-20220331-SS0I-LJ4K-TDF5-4XMRMGJNV9BD-low.png Figure 4-7 STO_FB Feedback Monitor Subsystem
Table 4-4 STO_FB Diagnostics Logic Table
Input 1: STO_1 Input 2: STO_2

Output_1:

STO_1_FB (Monitor_1)

Output_2:

STO_2_FB (Monitor_2)

Drive State STO_FB Comment
1 1 1 1 Normal operation 1
0 0 0 0 Safe state (off) 0
1 1 0

1

(stuck high fault)

Safe state (off) 0 (1) The MCU has detected a single dangerous fault (stuck high) in subsystem STO_2 and has triggered the safe state through STO_1 subsystem.
1 1

1

(stuck high fault)

0 Safe state (off) 0 (2) The MCU has detected a single dangerous fault (stuck high) in subsystem STO_1 and has triggered the safe state through STO_2 subsystem.
0 0 0

1

(stuck high fault)

Safe state (off) 0 Single detected fault could be detected earlier already, see (1) in above row.
0 0

1

(stuck high fault)

0 Safe state (off) 0 Single detected fault could be detected earlier already, see (2) in above row.
0 0

1

(stuck high fault)

1

(stuck high fault)

Normal operation 1 Dangerous state, due to two dangerous faults, one in each safe subsystem STO_1 and STO_2.

The STO_FB signal can be active low (logic state 0), while both STO_1 and STO_2 are inactive high (logic state 1). This state occurs when the diagnostics MCU (SIL 1) detects a single dangerous fault in one of the STO_1 or STO_2 subsystems. If a short or stuck high was found, the MCU puts the 3-phase IGBT inverter into a safe state by driving both diagnostic pulses MCU_Diag_Cntrl_Out1 and MCU_Diag_Cntrl_Out2 continuously low. This state can be used for example by an external safety PLC to recognize a single fault in either STO_1 or STO_2 systems and take appropriate actions. The safety PLC and related action are out of scope for this concept analysis.