SBOK093 December 2024 OPA4H199-SP
Table 1-1 lists the device information used in the TID HDR characterization.
| TID Exposure Details | |
|---|---|
| TI Device | OPA4H199-SP |
| Package | 14-pin SOT-23-THIN (DYY) |
| TI Part Name | 5962R2321401PXE |
| Technology | LBC9 (Linear BiCMOS 9) |
| Assembly Lot Number |
4185179PHI |
| Quantity Tested | HDR: 28 Devices
|
| HDR and LDR Radiation Facility | HDR: Texas Instruments Inc., CLAB, Dallas, TX |
| LDR: Radiation Test Solutions, Colorado Springs, Colorado | |
| HDR and LDR Dose Level | 100krad(Si) |
| HDR and LDR Dose Rate | HDR: 165mrads(Si)/s ionizing radiation dose rate1 |
| LDR: 10mrads(Si)/s ionizing radiation dose rate | |
| HDR and LDR Radiation Source | HDR: Gamma rays provided by Hopewell GR420 Co60 source. Dosimetry performed by Hopewell via GEX using GEX Alanine dosimeters |
| LDR: Gamma rays provided by JLSA 81-22 or JLSA 81-23 Co60 LDR source. Dosimetry performed by Air Ionization Chamber (AIC) traceable to NIST | |
| Irradiation Temperature | Ambient, room temperature controlled to 25°C (±6°C) per MIL-STD-883 and MIL-STD-750. |
Figure 1-1 OPA4H199-SP Example
Device