SBAA222A October   2017  – April 2025 ADS1282-SP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1 Overview
  5. 2 SEE Mechanisms
  6. 3 Test Device and Evaluation Board
  7. 4 Irradiation Facility and Setup
    1. 4.1 Depth, Range, and LETeff Calculation
  8. 5 Test Setup and Procedures
    1. 5.1 SEE Testing Block Diagram
    2. 5.2 Test Parameters
    3. 5.3 Test Conditions
  9. 6 SET Test Results
  10. 7 SEL Test Results
  11. 8 Conclusions
  12. 9 Acknowledgment
  13. 10References
  14. 11Revision History

8 Conclusions

TI's ADS1282-SP was tested for single-event effects. No latch-up was detected up to a LET of 50.5MeV × cm2/ mg and temperatures of 85°C and 125°C. The device exhibited single-event upsets in the data converter output with a threshold of 2.7MeV × cm2/ mg, and the saturated cross section was 3.7E–4 cm2.