SBAA222A October   2017  – April 2025 ADS1282-SP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1 Overview
  5. 2 SEE Mechanisms
  6. 3 Test Device and Evaluation Board
  7. 4 Irradiation Facility and Setup
    1. 4.1 Depth, Range, and LETeff Calculation
  8. 5 Test Setup and Procedures
    1. 5.1 SEE Testing Block Diagram
    2. 5.2 Test Parameters
    3. 5.3 Test Conditions
  9. 6 SET Test Results
  10. 7 SEL Test Results
  11. 8 Conclusions
  12. 9 Acknowledgment
  13. 10References
  14. 11Revision History

5.2 Test Parameters

The following parameters were measured during SEL and SET testing at approximately 1-second intervals:

  • DUT temperature
  • AVDD voltage and AVDD current
  • DVDD voltage and DVDD current
  • 3.3V supply on the memory test board
  • Beam shutter status
Table 5-1 lists the settings used for various parameters of the DUT and ion beam. Additionally, data conversion output was measured for SET testing.

Table 5-1 Settings Used for See Testing Parameters
PARAMETERSELSET
DUT temperature85°C and 125°CAmbient
AVDD+5.25V+4.75V
DVDD+3.6V+1.7V
Maximum fluence107 ions/cm2106 ions/cm2 or 100 events