SBAA222A October   2017  – April 2025 ADS1282-SP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1 Overview
  5. 2 SEE Mechanisms
  6. 3 Test Device and Evaluation Board
  7. 4 Irradiation Facility and Setup
    1. 4.1 Depth, Range, and LETeff Calculation
  8. 5 Test Setup and Procedures
    1. 5.1 SEE Testing Block Diagram
    2. 5.2 Test Parameters
    3. 5.3 Test Conditions
  9. 6 SET Test Results
  10. 7 SEL Test Results
  11. 8 Conclusions
  12. 9 Acknowledgment
  13. 10References
  14. 11Revision History

7 SEL Test Results

The device is SEL-free up to 50.5MeV × cm2/mg at 125°C. At 85°C, the device did not exhibit latch-up up to 60.4 MeV × cm2/mg.

Table 7-1 lists the runs and test conditions as well as the result of the runs for DUT serial numbers 11, 12, and 13. The SEL runs for serial numbers 11, 12, and 13 indicate the ADS1282-SP is latch-up immune to an LET of 50.5MeV × cm2/ mg at temperatures of 85°C and 125°C.

Table 7-1 SEL Run Log
RunSNIonLETeff (MeV × cm2/mg)Effective Fluence (ion/cm2)Temp (°C)Result
3011Ag at 0°42.81.00E+0785No Latch-up.
3111Ag at 32°50.59.97E+0685No Latch-up
3212Ag at 32°50.59.95E+0685No Latch-up
3313Ag at 32°50.59.99E+0685No Latch-up
3413Ag at 0°42.81.00E+07125No Latch-up. AVDD Current changed from 7.8mA to 8.6mA and the data output was 0x7FFFFFFF. After reset, the AVDD Current returned to normal and there was no degradation to the device.
3513Ag at 32°50.59.96E+06125No Latch-up
3612Ag at 32°50.51.00E+07125No Latch-up
3711Ag at 32°50.59.96E+06125No Latch-up
3911Xe at 0°52.39.99E+0685No Latch-up
4011Xe at 30°60.41.00E+0785No Latch-up

For SEL testing, the analog power supply, AVDD was set to 5.25V, and the digital power supply, DVDD, was set to 3.6V. Testing was performed at 85°C and 125°C with a control tolerance of ±5°C.

The observed results indicate that the ADS1282-SP is immune to latch-up to a LET of 50.5MeV × cm2/mg at a temperature of 125°C and up to 60.4MeV × cm2/mg at a temperature of 85°C.

Figure 7-1 and Figure 7-2 illustrate representative SEL current measurements for a run without event, and a run with an event.

Representative SEL Current Measurements Without EventFigure 7-1 Representative SEL Current Measurements Without Event
Representative SEL Current Measurements With EventFigure 7-2 Representative SEL Current Measurements With Event