SBAA222A October   2017  – April 2025 ADS1282-SP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1 Overview
  5. 2 SEE Mechanisms
  6. 3 Test Device and Evaluation Board
  7. 4 Irradiation Facility and Setup
    1. 4.1 Depth, Range, and LETeff Calculation
  8. 5 Test Setup and Procedures
    1. 5.1 SEE Testing Block Diagram
    2. 5.2 Test Parameters
    3. 5.3 Test Conditions
  9. 6 SET Test Results
  10. 7 SEL Test Results
  11. 8 Conclusions
  12. 9 Acknowledgment
  13. 10References
  14. 11Revision History

6 SET Test Results

A SET event is defined as the duration when the absolute value of the (sample – reference) is greater than the mask threshold [6]. As an example, if ten consecutive samples exceed the reference sample by greater than the mask threshold, then this is one error event and ten errors. The number of error events were used to determine the number of transients collected until the run is stopped [6].

SET testing was performed with AVDD set to 4.75V and DVDD set to 1.7V. Figure 6-1 shows the cross-section for register upsets. Weibull fit parameters are shown in Table 6-1.

Table 6-1 Weibull Fit Parameters for Register Upsets
PARAMETERVALUE
LETth (MeV × cm2/mg)1.4
σ sat (cm2)1.3E–05
Width, W (MeV × cm2/mg)15
Exponent, s1.4

Table 6-2 lists the runs and test conditions as well as the result of the runs for DUT serial numbers 11 and 14. Note the DUT board with serial number 14 was configured with the bypass pin connected directly to DVDD.

Table 6-2 SET Run Log
RunSNIonLETeff (MeV × cm2/mg)Effective Fluence (ion/cm2)AVDD (Volts)DVDD (Volts)ConfigErrorsError EventsDRDY_N ErrorsComments
2611Ag at 0°42.89.65E+054.753AIN163064002455
2711Ag at 0°42.89.75E+054.753AIN2Configuration Registers Reset
2811Ag at 0°42.81.02E+065.253AIN155931831661
2911Ag at 0°42.89.44E+055.253AIN2Configuration Registers Reset
3811Xe at 0°52.31.03E+065.253AIN166792221323
4914Xe at 0°52.31.05E+064.751.7AIN142881764308
5014Xe at 0°52.39.85E+054.751.7AIN2Configuration Registers Reset
5114Ar at 0°8.49.67E+054.751.7AIN1626958134
5214Ar at 0°8.41.06E+064.751.7AIN2Configuration Registers Reset
5314Ne at 0°2.71.02E+064.751.7AIN1110
5414Ne at 0°2.71.03E+064.751.7AIN2440No Configuration Registers Reset
5514Kr at 0°28.31.00E+064.751.7AIN137463641010
5614Kr at 0°28.31.01E+064.751.7AIN2Configuration Registers Reset
Cross-Section for Register UpsetsFigure 6-1 Cross-Section for Register Upsets

To disambiguate noise from bit errors, the least significant bits of the data conversion output were masked until no error events were observed under no irradiation. The ion beam was subsequently turned on, and the output was observed until the specified number of transients were recorded or the fluence reached 106 ions/cm2.

During SEL testing and during some of the SET runs, single-event functional interrupts (SEFI) were observed, which required the device to be reset to restore functionality. Cross-section data on this error mode cannot be calculated with any confidence as the device reset under irradiation and some SEFI may clear before they are detected. At the same time, runs that exhibited a SEFI mode would inhibit the collection of further SET and thus will underestimate the error cross section [6].

To avoid confounding of multiple error sources, the test runs in which register SEU’s were observed were excluded when calculating the SET cross section. Figure 6-2 shows the resulting cross section, and the Weibull fit parameters are listed in Table 6-3.

Table 6-3 Weibull Fit Parameters
PARAMETERVALUE
LETth (MeV × cm2/mg)2.7
σ sat (cm2)3.7E–04
Width, W (MeV·cm2/mg)27
Exponent, s0.9
SET Cross SectionFigure 6-2 SET Cross Section