|V(ESD)||Electrostatic discharge||Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1)||±2000||V|
|Charged-device model (CDM), per JEDEC specification JESD22-C101(2)||±500|
|IEC 61000-4-2 contact discharge(3)||±8000|
|IEC 61000-4-2 air-gap discharge(3)||±15000|
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
(3) Surges per EN61000-4-2, 1999 applied between RJ-45 and output ground and between adapter input and output ground of the TPS23753AEVM-001 (HPA304-001) evaluation module (documentation available on the web). These were the test levels, not the failure threshold.