ZHCSKG3B September   2016  – February 2024 DS280DF810

PRODUCTION DATA  

  1.   1
  2. 特性
  3. 应用
  4. 说明
  5. Pin Configuration and Functions
  6. Specifications
    1. 5.1  Absolute Maximum Ratings
    2. 5.2  ESD Ratings
    3. 5.3  Recommended Operating Conditions
    4. 5.4  Thermal Information
    5. 5.5  Electrical Characteristics
    6. 5.6  Timing Requirements, Retimer Jitter Specifications
    7. 5.7  Timing Requirements, Retimer Specifications
    8. 5.8  Timing Requirements, Recommended Calibration Clock Specifications
    9. 5.9  Recommended SMBus Switching Characteristics (Target Mode)
    10. 5.10 Recommended SMBus Switching Characteristics (Controller Mode)
    11. 5.11 Typical Characteristics
  7. Detailed Description
    1. 6.1 Overview
    2. 6.2 Functional Block Diagram
    3. 6.3 Feature Description
      1. 6.3.1 Device Data Path Operation
        1. 6.3.1.1 AC-Coupled Receiver and Transmitter
        2. 6.3.1.2 Signal Detect
        3. 6.3.1.3 Continuous Time Linear Equalizer (CTLE)
        4. 6.3.1.4 Variable Gain Amplifier (VGA)
        5. 6.3.1.5 2x2 Cross-Point Switch
        6. 6.3.1.6 Decision Feedback Equalizer (DFE)
        7. 6.3.1.7 Clock and Data Recovery (CDR)
        8. 6.3.1.8 Calibration Clock
        9. 6.3.1.9 Differential Driver with FIR Filter
          1. 6.3.1.9.1 Setting the Output VOD, Pre-Cursor, and Post-Cursor Equalization
          2. 6.3.1.9.2 Output Driver Polarity Inversion
      2. 6.3.2 Debug Features
        1. 6.3.2.1 Pattern Generator
        2. 6.3.2.2 Pattern Checker
        3. 6.3.2.3 Eye Opening Monitor
        4. 6.3.2.4 Interrupt Signals
    4. 6.4 Device Functional Modes
      1. 6.4.1 Supported Data Rates
      2. 6.4.2 SMBus Controller Mode
      3. 6.4.3 42
      4. 6.4.4 Device SMBus Address
    5. 6.5 Programming
      1. 6.5.1 Bit Fields in the Register Set
      2. 6.5.2 Writing to and Reading from the Global/Shared/Channel Registers
    6. 6.6 Register Maps
  8. Application and Implementation
    1. 7.1 Application Information
    2. 7.2 Typical Application
      1. 7.2.1 Backplane and Mid-Plane Reach Extension Application
        1. 7.2.1.1 Design Requirements
        2. 7.2.1.2 Detailed Design Procedure
      2. 7.2.2 Front-Port Jitter Cleaning Application
        1. 7.2.2.1 Design Requirements
        2. 7.2.2.2 Detailed Design Procedure
      3. 7.2.3 Application Curves
    3. 7.3 Power Supply Recommendations
    4. 7.4 Layout
      1. 7.4.1 Layout Guidelines
      2. 7.4.2 Layout Example
  9. Device and Documentation Support
    1. 8.1 Documentation Support
      1. 8.1.1 Related Documentation
    2. 8.2 接收文档更新通知
    3. 8.3 支持资源
    4. 8.4 Trademarks
    5. 8.5 静电放电警告
    6. 8.6 术语表
  10. Revision History
  11. 10Mechanical, Packaging, and Orderable Information

封装选项

请参考 PDF 数据表获取器件具体的封装图。

机械数据 (封装 | 引脚)
  • ABW|135
  • ABV|135
散热焊盘机械数据 (封装 | 引脚)
订购信息

ESD Ratings

VALUEUNIT
V(ESD)Electrostatic dischargeHuman-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1)±2,000V
Charged-device model (CDM), per JEDEC specification JESD22-C101(2)±1,000V
JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. Manufacturing with less than 500-V HBM is possible with the necessary precautions. Pins listed as ±2,000V may actually have higher performance.
JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process. Manufacturing with less than 250-V CDM is possible with the necessary precautions. Pins listed as ±1,000V may actually have higher performance.