6.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted).(1)
|
MIN |
MAX |
UNIT |
| Supply Voltage(2)(3) |
VDDC (Core 1.2-V Power) |
–0.5 |
1.7 |
V |
| VDD33 |
–0.5 |
3.8 |
V |
| VDD_DMD |
–0.5 |
2.3 |
V |
| VDD12_FPD |
–0.5 |
1.7 |
V |
| VDD33_FPD |
–0.5 |
3.8 |
V |
| VDD12_PLLD |
–0.5 |
1.7 |
V |
| VDD12_PLLM |
–0.5 |
1.7 |
V |
| VDD_18_PLLD |
–0.5 |
2.3 |
V |
| VDD_18_PLLM |
–0.5 |
2.3 |
V |
| Input Voltage (VI)(4) |
USB |
–1.00 |
5.25 |
V |
| OSC |
–0.3 |
3.6 |
V |
| LVCMOS |
–0.5 |
3.6 |
V |
| I2C |
–0.5 |
3.6 |
V |
| LVDS |
–0.5 |
3.6 |
V |
| Output Voltage (VO) |
USB |
–1.00 |
5.25 |
V |
| DMD LPDDR |
–0.3 |
2.0 |
V |
| LVCMOS |
–0.5 |
3.6 |
V |
| I2C |
–0.5 |
3.6 |
V |
| TJ |
Junction temperature |
0 |
105 |
ºC |
| Tstg |
Storage temperature |
-40 |
125 |
ºC |
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltages referenced to VSS (ground).
(3) All of the 3.3-V, 1.9-V, 1.8-V, and 1.2-V power should be applied and removed per the procedure defined in System Power and Reset.
(4) Applies to external input and bidirectional buffers.