6.1 Absolute Maximum Ratings
over operating free-air temperature (unless otherwise noted) (see (1))
|
MIN |
MAX |
UNIT |
| SUPPLY VOLTAGE(2)(3) |
| V(VDD) (core) |
–0.3 |
1.21 |
V |
| V(VDDLP12) (core) |
–0.3 |
1.32 |
V |
| Power + sub-LVDS |
–0.3 |
1.96 |
V |
| V(VCC_INTF) |
Host I/O power |
–0.3 |
3.60 |
V |
| If 1.8-V power used |
–0.3 |
1.99 |
| If 2.5-V power used |
–0.3 |
2.75 |
| If 3.3-V power used |
–0.3 |
3.60 |
| V(VCC_FLSH) |
Flash I/O power |
–0.3 |
3.60 |
V |
| If 1.8-V power used |
–0.3 |
1.96 |
| If 2.5-V power used |
–0.3 |
2.72 |
| If 3.3-V power used |
–0.3 |
3.58 |
| V(VDD_PLLM) (MCG PLL) |
–0.3 |
1.21 |
V |
| V(VDD_PLLD) (DCG PLL) |
–0.3 |
1.21 |
V |
| GENERAL |
| TJ |
Operating junction temperature |
–30 |
125 |
°C |
| Tstg |
Storage temperature |
–40 |
125 |
°C |
(1) Stresses beyond those listed under
Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under
Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltage values are with respect to GND.
(3) Overlap currents, if allowed to continue flowing unchecked, not only increase total power dissipation in a circuit, but degrade the circuit reliability, thus shortening its usual operating life.