12 Revision History
Changes from Revision C (November 2016) to Revision D (February 2024)
- 更新了整个文档中的表格、图和交叉参考的编号格式Go
- 添加了 CDCE913-Q1 功能安全信息Go
- 将提到 I2C 的旧术语实例通篇更改为控制器和目标。Go
- 将器件信息 表更改为封装信息
Go
- Removed the thermal pad from the TSSOP pinoutGo
- Added Y1 to Y3 cycle-to-cycle jitter and Peak-to-peak period jitter
specs with tablenotes explaining the configuration differences Go
- Deleted sentence - A different default setting can be programmed
upon customer request. Contact Texas Instruments sales or marketing
representative for more information.Go
- Changed units from kbit/s to kbpsGo
- Added information on allowable data inputs during the EEPROM write cycle in Data Protocol
Go
Changes from Revision B (September 2016) to Revision C (November 2016)
- 说明了 CDCEL913-Q1 器件的不同温度范围。Go
- Deleted old table notes from the Thermal Information table. Go
Changes from Revision A (June 2013) to Revision B (September 2016)
- 添加了特性说明 部分、器件功能模式、应用和实现 部分、电源相关建议 部分、布局 部分、器件和文档支持 部分以及机械、封装和可订购信息 部分。Go
- Changed ESD Ratings: Human-body model (HBM) from 2500 V to 2000 V
and Charged-device model (CDM) from 500 V to 1000 V.Go
- Changed second S to Sr in Byte Read
Protocol.Go
Changes from Revision * (June 2013) to Revision A (June 2013)
- 更改了 CDM ESD 分类等级。Go
- Added ESD ratings.Go
- Changed IDDPD typical From: 20 To: 30Go
- Changed II LVCMOS input current value from typical to
maximum.Go
- Changed IIH LVCMOS input current for S0, S1, and S2 value
from typical to maximum.Go
- Changed IIL LVCMOS input current for S0, S1, and S2 value
from typical to maximum.Go
- Changed Test Load for 50-Ω Board
Environment.Go
- Changed Output Selection From: (Y2, Y9) To: (Y2,
Y3).Go
- Changed text note for Block Write Protocol.Go
- Changed 01h, Bit 7 From: For internal use – always
write 1 To: Reserved – always write 0.Go
- Changed 06h, 7:1 From: 30h To: 20hGo