ZHCSMY7J July   2021  – November 2023 BQ77216

PRODUCTION DATA  

  1.   1
  2. 特性
  3. 应用
  4. 说明
  5. 说明(续)
  6. Device Comparison Table
  7. Pin Configuration and Functions
  8. Specifications
    1. 7.1 Absolute Maximum Ratings
    2. 7.2 ESD Ratings
    3. 7.3 Recommended Operating Conditions
    4. 7.4 Thermal Information
    5. 7.5 DC Characteristics
    6. 7.6 Timing Requirements
  9. Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1 Voltage Fault Detection
      2. 8.3.2 Open-Wire Fault Detection
      3. 8.3.3 Temperature Fault Detection
      4. 8.3.4 Oscillator Health Check
      5. 8.3.5 Sense Positive Input for Vx
      6. 8.3.6 Output Drive, COUT and DOUT
      7. 8.3.7 The LATCH Function
      8. 8.3.8 Supply Input, VDD
    4. 8.4 Device Functional Modes
      1. 8.4.1 NORMAL Mode
      2. 8.4.2 FAULT Mode
      3. 8.4.3 Customer Test Mode
  10. Application and Implementation
    1. 9.1 Application Information
      1. 9.1.1 Design Requirements
      2. 9.1.2 Detailed Design Procedure
        1. 9.1.2.1 Cell Connection Sequence
    2. 9.2 Systems Example
  11. 10Power Supply Recommendations
  12. 11Layout
    1. 11.1 Layout Guidelines
    2. 11.2 Layout Example
  13. 12Device and Documentation Support
    1. 12.1 第三方产品免责声明
    2. 12.2 接收文档更新通知
    3. 12.3 支持资源
    4. 12.4 Trademarks
    5. 12.5 静电放电警告
    6. 12.6 术语表
  14. 13Revision History
  15. 14Mechanical, Packaging, and Orderable Information

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机械数据 (封装 | 引脚)
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Voltage Fault Detection

In the BQ77216 device, each cell is monitored independently. Overvoltage is detected by comparing the actual cell voltage to a protection voltage reference, VOV. If any cell voltage exceeds the programmed OV value, a timer circuit is activated. When the timer expires, the COUT pin goes from inactive to active state. The timer is reset if the cell voltage falls below the recovery threshold (VOV – VOV_HYS). Undervoltage is detected by comparing the actual cell voltage to a protection voltage reference, VUV. If any cell voltage falls below the programmed UV value, a timer circuit is activated. When the timer expires, the DOUT pin goes from inactive to active state. The timer is reset if the cell voltage rises below the recovery threshold (VUV + VUV_HYS).

GUID-F75E693D-599F-45AF-A0B1-6F30A0A36D47-low.gifFigure 8-1 Timing for Overvoltage Sensing
GUID-78A3C5F3-0506-470D-B5FF-12D20164081F-low.gifFigure 8-2 Timing for Undervoltage Sensing