ZHCSIZ3M January   1979  – March 2024 AM26LS31 , AM26LS31M

PRODUCTION DATA  

  1.   1
  2. 1 特性
  3. 2 应用
  4. 3 说明
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 ESD Ratings
    3. 5.3 Recommended Operating Conditions
    4. 5.4 Thermal Information
    5. 5.5 Electrical Characteristics
    6. 5.6 Switching Characteristics – AM26LS31
    7. 5.7 Switching Characteristics – AM26LS31M
    8. 5.8 Typical Characteristics
  7. 6 Parameter Measurement Information
  8. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Complementary Output-Enable Inputs
      2. 7.3.2 High Output Impedance in Power-Off Conditions
      3. 7.3.3 Complementary Outputs
    4. 7.4 Device Functional Modes
  9. 8 Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
      3. 8.2.3 Application Curve
    3. 8.3 Power Supply Recommendations
    4. 8.4 Layout
      1. 8.4.1 Layout Guidelines
      2. 8.4.2 Layout Example
  10. 9 Device and Documentation Support
    1. 9.1 Documentation Support
      1. 9.1.1 Related Documentation
    2. 9.2 接收文档更新通知
    3. 9.3 支持资源
    4. 9.4 Trademarks
    5. 9.5 静电放电警告
    6. 9.6 术语表
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information

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5.8 Typical Characteristics

GUID-B206DFBA-87B8-4053-8CCD-9AE1DFAACFEA-low.gif
A. The A input is connected to VCC during testing of the Y outputs and to ground during testing of the Z outputs.
Figure 5-1 Output Voltage vs Enable G Input Voltage
GUID-9A9BDB3F-8CBF-4701-8441-B4E7B66C65F0-low.gif
B. The A input is connected to ground during testing of the Y outputs and to VCC during testing of the Z outputs.
Figure 5-3 Output Voltage vs Enable G Input Voltage
GUID-657FF04C-981F-4CB3-82A9-2CF638D3A9A8-low.gif
A. The A input is connected to VCC during testing of the Y outputs and to ground during testing of the Z outputs.
Figure 5-5 High-Level Output Voltage vs Free-Air Temperature
GUID-0E44B7F1-6554-4380-96BA-EE57BD56F0E5-low.gif
B. The A input is connected to ground during testing of the Y outputs and to VCC during testing of the Z outputs.
Figure 5-7 Low-Level Output Voltage vs Free-Air Temperature
GUID-29B244B6-9A92-49E6-A59F-C5ED92949C99-low.gifFigure 5-9 Y Output Voltage vs Data Input Voltage
GUID-83E2DE9E-BB60-4CC2-9C8A-C9D413CEA33F-low.gif
A. The A input is connected to VCC during testing of the Y outputs and to ground during testing of the Z outputs.
Figure 5-2 Output Voltage vs Enable G Input Voltage
GUID-222689DF-EE5C-4EA0-B1B2-1A83063CDDFE-low.gif
B. The A input is connected to ground during testing of the Y outputs and to VCC during testing of the Z outputs.
Figure 5-4 Output Voltage vs Enable G Input Voltage
GUID-EFB58EC4-2F42-41E7-AB40-CA6846CC4CCA-low.gif
A. The A input is connected to VCC during testing of the Y outputs and to ground during testing of the Z outputs.
Figure 5-6 High-Level Output Voltage vs High-Level Output Current
GUID-3536A11A-4819-418C-A781-08D3C94B5581-low.gif
B. The A input is connected to ground during testing of the Y outputs and to VCC during testing of the Z outputs.
Figure 5-8 Low-Level Output Voltage vs Low-Level Output Current
GUID-DAB984E7-836C-4343-A807-F0015DB99337-low.gifFigure 5-10 Y Output Voltage vs Data Input Voltage