SLAK024A January   2019  – March 2024 TPS73801-SEP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Overview
  5. 2Single-Event Effects
  6. 3Test Device and Evaluation Board Information
  7. 4Irradiation Facility and Setup
  8. 5Test Setup and Procedures
  9. 6Single-Event-Burnout (SEB) and Single-Event-Latch-up (SEL)
    1. 6.1 Single-Event-Burnout (SEB)
    2. 6.2 Single-Event-Latch-up (SEL)
  10. 7SET Results
  11. 8Summary
  12.   A Confidence Interval Calculations
  13.   B References
  14.   C Revision History

6.2 Single-Event-Latch-up (SEL)

For the SEL characterization the LDO was heated up to 125°C using a forced hot air aimed at the die. Temperature was monitored using a K-type thermocouple attached to the SEP DEM-SOT223LDO DEM.47Ag incident at 0 is used for the characterization. The distance between the heavy-ion exit port and the DUT was held constant at 40mm for all test. Flux of 105 and fluences up to 107 is used. SEL result is listed in Table 6-2. No SEL events was observed under any of the test runs. Upper bound cross section is calculated using the MTBF described on Appendix A.

σSEL ≤ 2.31 × 10–8 cm2/ device at LET ≤ 43MeV-cm2/ mg, T = 125°C and 95% confidence.

Table 6-2 Summary of the TPS73801-SEP SEL Results (1)
Run NumberUnit NumberLETEFF (MeV-cm2/ mg)Ion TypeIncident Angle (°)Fluence (ions / cm2)Vin (V)Vout (V)Load (A)SEL Events
17443Ag010751.20.0200
(1) All data collected and discussed on this table was collected at T = 125°C.