SLAK024A January   2019  – March 2024 TPS73801-SEP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Overview
  5. 2Single-Event Effects
  6. 3Test Device and Evaluation Board Information
  7. 4Irradiation Facility and Setup
  8. 5Test Setup and Procedures
  9. 6Single-Event-Burnout (SEB) and Single-Event-Latch-up (SEL)
    1. 6.1 Single-Event-Burnout (SEB)
    2. 6.2 Single-Event-Latch-up (SEL)
  10. 7SET Results
  11. 8Summary
  12.   A Confidence Interval Calculations
  13.   B References
  14.   C Revision History

B References

  1. J.L. Titus, G.H. Johnson, R.D. Schrimpf, K.F. Galloway, "Single event burnout of power bipolar junction transistors," IEEE Trans. on Nuclear Science, vol. NS-38, no. 6, pp. 1315-1322, 1991.
  2. S. Kuboyama, T. Suzuki, T. Hirao and S. Matsuda, "Mechanism for single-event burnout of bipolar transistors," in IEEE Transactions on Nuclear Science, vol. 47, no. 6, pp. 2634-2639, Dec 2000.
  3. Texas A&M University, Cyclotron Institute Radiation Effects Facility, webpage.
  4. Lawrence Berkeley National Laboratory, 88-Inch Cyclotron Berkeley Accelerator Space Effects (BASE), webpage.
  5. M. K. Covo et al., "88-Inch Cyclotron: The one-stop facility for electronics radiation testing," 2017 IEEE International Workshop on Metrology for AeroSpace (MetroAeroSpace), Padua, 2017, pp. 484-488.
  6. Ziegler, James F., website. The Stopping and Range of Ions in Matter (SRIM) Software Simulation Tools, webpage.
  7. P. C. Adell, R. D. Schrimpf, B. K. Choi, W. T. Holman, J. P. Attwood, C. R. Cirba, and K. F. Galloway, “Total-Dose and Single-Event Effects in Switching DC/DC Power Converters,” IEEE Trans. Nucl. Sci. Vol. 49(6), Dec. 2002, pp. 3217–3221.
  8. R. L. Pease, “Modeling Single Event Transients in Bipolar Linear Circuits,” IEEE Trans. Nucl. Sci., Vol. 55(4), Aug. 2008, pp. 1879–1890.
  9. R. Lveugle and A. Ammari, “Early SEU Fault Injection in Digital, Analog and Mixed Signal Circuits: a Global Flow,” Proc. of Design, Automation and Test in Europe Conf., 2004, pp. 1530–1591.
  10. P. C. Adell, R. D. Schrimpf, B. K. Choi, W. T. Holman, J. P. Attwood, C. R. Cirba, and K. F. Galloway, “Total-Dose and Single-Event Effects in Switching DC/DC Power Converters,” IEEE Trans. Nucl. Sci., Vol. 49(6), Dec. 2002, pp. 3217–3221.
  11. D. Kececioglu, “Reliability and Life Testing Handbook”, Vol. 1, PTR Prentice Hall, New Jersey,1993, pp. 186–193.