SLAK024A January   2019  – March 2024 TPS73801-SEP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Overview
  5. 2Single-Event Effects
  6. 3Test Device and Evaluation Board Information
  7. 4Irradiation Facility and Setup
  8. 5Test Setup and Procedures
  9. 6Single-Event-Burnout (SEB) and Single-Event-Latch-up (SEL)
    1. 6.1 Single-Event-Burnout (SEB)
    2. 6.2 Single-Event-Latch-up (SEL)
  10. 7SET Results
  11. 8Summary
  12.   A Confidence Interval Calculations
  13.   B References
  14.   C Revision History

8 Summary

The purpose of this report is summarize the SEE of the TPS73801-SEP under heavy ions. The data shows that the TPS73801-SEP is SEB and SEL free across the full electrical specifications and up to 43MeV-cm2/ mg with fluence of 107 ions / cm2. No SEL or SEB was observed, and the cross section for the SEL and SEB is shown to be on the order of 10–8 cm2 / device. See Section 6 for more details.

SETs were characterized at different output voltages and across the full load of the TPS73801-SEP. Only seven transients higher than 5% were observed on 16 runs. Those transients were all observed at VOUT = 2.5V. Worst case for SETs deviations is observed at lower output voltages, and worst case transients response time are observed at light loads. The SET cross section is shown to be on the order of 10–8 cm2/ device.