27 Revision History
Changes from Revision B (October 2020) to Revision C (December 2024)
- 将整个文档中的标准名称从“DIN V VDE V 0884-11:2017-01”更改为“DIN EN IEC 60747-17 (VDE 0884-17)”Go
- 通篇删除了对标准 IEC/EN/CSA 60950-1 的引用Go
- 通篇删除了所有标准名称中的标准版本和年份参考Go
- 更新了整个文档中的表格、图和交叉参考的编号格式Go
- Added "Contact discarge per IEC 61000-4-2" specification of 8000V Go
- Changed "Signaling rate" to "Data rate" and added table noteGo
- Updated maximum power dissipation in the power ratings section.Go
- Updated distance through isolation, while maintaining other insulation specificationsGo
- Updated DW-16 package VIORM and VIOWM valuesGo
- Added TDDB figure reference to VIOWM
Go
- Updated VIOSM, VIOTM, qpd test conditionsGo
- Updated maximum total current consumption values throughout the supply current characteristics sections.Go
- Updated maximum propagation delay specifications throughout the switching characteristics sections.Go
- Updated TDDB plot and the projected lifetime.Go
- Changed working voltage lifetime margin from: 87.5% to: 50%, minimum
required insulation lifetime from: 37.5 years to: 30 years and insulation
lifetime per TDDB from: 135 years to: 169 years per DIN EN IEC 60747-17 (VDE
0884-17)Go
- Changed Figure 25-5 per DIN EN
IEC 60747-17 (VDE 0884-17)Go
Changes from Revision A (April 2020) to Revision B (October 2020)
- 在节 1中添加了“功能安全”要点Go
- Added D-8 values for TUVGo
Changes from Revision * (March 2017) to Revision A (April 2020)
- 通篇进行了编辑性和修饰性更改Go
- 将“隔离栅寿命：超过 40 年”更改为“在 1500VRMS 工作电压下预计寿命超过 100 年”（位于节 1）Go
- 在节 1中添加了“隔离等级高达 5000VRMS”Go
- 在节 1中添加了“浪涌能力高达 12.8kV”Go
- 在节 1中添加了“在整个隔离栅具有 ±8kV IEC 61000-4-2 接触放电保护”Go
- 将“符合 DIN V VDE V 0884-10 (VDE V 0884-10):2006-12 标准的 VDE 增强型绝缘”更改为“符合 DIN VDE V 0884-11:2017-01 标准的 VDE 增强型绝缘”（位于节 1）Go
- 使用节 1 中的标准名称，将 CSA、CQC 和 TUV 要点合并为一个要点Go
- 删除了节 1中的“完成 DW-16 封装的 VDE、UL、CSA 和 TUV 认证；已规划其他所有认证”要点Go
- 更新了节 2部分的应用列表Go
- 更新了图 3-1，以便显示两个串联的隔离电容器，而不是单个隔离电容器Go
- Added Climatic categoryGo
- Updated CSA column and changed DW package to (DW-16)Go
- Changed tie TYP value from 1.5 to 1 in Switching Characteristics tables throughout the documentGo
- Corrected ground symbols for "Input (Devices with F suffix)" in Section 24.4.1
Go
- Fixed Figure 25-2 INPUT wire connection Go
- Added Section 25.2.3.1 sub-section under Section 25.2.3 section Go
- Added 'How to use isolation to improve ESD, EFT, and Surge immunity in industrial systems' to Section 26.1 section Go