SWRA370A September   2011  – December 2025 CC1100 , CC1101 , CC2500 , CC2510 , CC2520 , CC2530 , CC2530-RF4CE , CC2540 , CC2540T , CC2541 , CC2541-Q1

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Introduction
    1. 1.1 Acronyms
  5. 2Standards and System Requirements
    1. 2.1 Standards
    2. 2.2 Test Equipment Suppliers
    3. 2.3 Radio Certification URLs
  6. 3Test Equipment Requirements
    1. 3.1 System Setup
      1. 3.1.1 Conducted Test Systems
      2. 3.1.2 Radiated Test Systems
    2. 3.2 Initial Considerations for Testing
    3. 3.3 Testing Reminders
  7. 4Software Setup
    1. 4.1 SmartRF Studio 7
      1. 4.1.1 SmartRF Studio 7 Start-Up Window
      2. 4.1.2 SmartRF Studio 7 Modes
      3. 4.1.3 SmartRF Studio 7 Device Control Panel
      4. 4.1.4 SmartRF Studio 7 Software User Manual
    2. 4.2 SmartRF Studio 8
      1. 4.2.1 SmartRF Studio 8 Start-Up Window
      2. 4.2.2 SmartRF Studio 8 Radio Control Window
      3. 4.2.3 SmartRF Studio 8 Software User Guide
  8. 5DUT and Test Instrument Information
    1. 5.1 DUT
    2. 5.2 Test Instruments
  9. 6Clock Frequency Tuning
    1. 6.1 HF Clock Tuning Utilizing the Internal Cap Array
    2. 6.2 LF Clock Tuning
  10. 7Transmission Tests
    1. 7.1 Transmission Power
    2. 7.2 Power Spectral Density Mask
    3. 7.3 Error Vector Magnitude
    4. 7.4 Transmission Center Frequency Offset
    5. 7.5 Spurious Emissions
  11. 8Receive Testing
    1. 8.1 Receiver Sensitivity
    2. 8.2 Interference Testing
    3. 8.3 Interference Testing with RF Generator
  12.   Appendix A Offset EVM vs. EVM
  13.   B References
  14.   B Revision History

3.1 System Setup

This document describes two types of test system configurations: conducted and radiated testing. This section briefly describes each configuration. The actual setup can vary per test and is depicted in the beginning of each test. All tests will be conducted unless specified that the test can be radiated.