SPRZ357P August   2011  – June 2020 F28M35E20B , F28M35H22C , F28M35H52C , F28M35H52C-Q1 , F28M35M22C , F28M35M52C

 

  1.   F28M35x Concerto MCUs Silicon Errata Silicon Revisions E, B, A, 0
    1. 1 Introduction
    2. 2 Device and Development Support Tool Nomenclature
    3. 3 Device Markings
    4. 4 Usage Notes and Known Design Exceptions to Functional Specifications
      1. 4.1 Usage Notes
        1. 4.1.1  PIE: Spurious Nested Interrupt After Back-to-Back PIEACK Write and Manual CPU Interrupt Mask Clear
        2. 4.1.2  FPU32 and VCU Back-to-Back Memory Accesses
        3. 4.1.3  Caution While Using Nested Interrupts
        4. 4.1.4  PBIST: PBIST Memory Test Feature is Deprecated
        5. 4.1.5  HWBIST: Cortex-M3 HWBIST Feature is Deprecated
        6. 4.1.6  HWBIST: C28x HWBIST Feature Support is Restricted to TI-Supplied Software
        7. 4.1.7  Flash Tools: Device Revision Requires a Flash Tools Update
        8. 4.1.8  EPI: New Feature Addition to EPI Module
        9. 4.1.9  EPI: ALE Signal Polarity
        10. 4.1.10 EPI: CS0/CS1 Swap
        11. 4.1.11 Major Device Revision
      2. 4.2 Known Design Exceptions to Functional Specifications
    5. 5 Documentation Support
  2.   Trademarks
  3.   Revision History

4.1.3 Caution While Using Nested Interrupts

Revision(s) Affected: 0, A, B, E

If the user is enabling interrupts using the EINT instruction inside an interrupt service routine (ISR) in order to use the nesting feature, then the user must disable the interrupts before exiting the ISR. Failing to do so may cause undefined behavior of CPU execution.