SPRAD52 August   2022 AM2431 , AM2432 , AM2434 , AM6411 , AM6412 , AM6421 , AM6422 , AM6441 , AM6442

 

  1.   AM574x Extended Power-On Hours (POH)
  2.   Trademarks
  3. 1Introduction
  4. 2Wear-Out Mechanisms
  5. 3Guidelines for Extended POH
  6. 4Summary
  7. 5References

2 Wear-Out Mechanisms

Calculating Useful Lifetimes of Embedded Processors provides a methodology for calculating the useful lifetime of TI embedded processors under power when used in electronic systems. It discusses the stages of reliability, the useful life period, and complementary metal-oxide semiconductor (CMOS) wear-out mechanisms. The primary wear-out mechanism discussed in the application note was electro-migration.

As each semiconductor process node is unique, some wear-out mechanism may affect the estimated lifetime of the devices in different ways.

For the AM64x/AM243x, the following CMOS wear-out mechanisms were evaluated to extend the estimated operational lifetime of the device:

  • Electro-Migration
  • Gate Oxide Integrity
  • Negative Bias Temperature Instability
  • Channel Hot Carrier

The guidelines detailed in the next section were generated as a result of that evaluation.