SNVA966 July   2020  – MONTH  LP8864-Q1 , LP8864S-Q1 , LP8866-Q1 , LP8866S-Q1

 

  1.   Trademarks
  2. 1Fault Handling Routine
  3. 2Different Fault and Diagnostic Handling Method Recommendation
    1. 2.1 Different Fault Handling Method
      1. 2.1.1 System Brightness Derating
      2. 2.1.2 System-Level Unrecoverable Critical Fault
      3. 2.1.3 System-Level Sustainable Fault
    2. 2.2 Different Diagnostic Wrong Information Handling Method
      1. 2.2.1 System-Level Critical Wrong Diagnostic Information
      2. 2.2.2 System Level Sustainable Wrong Diagnostic Information
  4. 3Summary
  5.   A Fault-Related Functions
    1.     A.1 Protection and Fault Detections
      1.      A.1.1 Supply Faults
        1.       A.1.1.1 VIN Undervoltage Faults (VINUVLO)
        2.       16
        3.       A.1.1.2 VIN Overvoltage Faults (VINOVP)
        4.       A.1.1.3 VDD Undervoltage Faults (VDDUVLO)
        5.       A.1.1.4 VIN OCP Faults (VINOCP)
        6.       A.1.1.5 Charge Pump Faults (CPCAP, CP)
        7.       A.1.1.6 Boost Sync Clock Invalid Faults (BSTSYNC)
        8.       A.1.1.7 CRC Error Faults (CRCERR)
      2.      A.1.2 Boost Faults
        1.       A.1.2.1 Boost Overvoltage Faults (BSTOVPL, BSTOVPH)
        2.       A.1.2.2 Boost Overcurrent Faults (BSTOCP)
        3.       A.1.2.3 LEDSET Resistor Missing Faults (LEDSET)
        4.       A.1.2.4 MODE Resistor Missing Faults (MODESEL)
        5.       A.1.2.5 FSET Resistor Missing Faults (FSET)
        6.       A.1.2.6 ISET Resistor Out of Range Faults (ISET)
        7.       A.1.2.7 Thermal Shutdown Faults (TSD)
      3.      A.1.3 LED Faults
        1.       A.1.3.1 Open LED Faults (OPEN_LED)
        2.       A.1.3.2 Short LED Faults (SHORT_LED)
        3.       A.1.3.3 LED Short to GND Faults (GND_LED)
        4.       A.1.3.4 Invalid LED String Faults (INVSTRING)
        5.       A.1.3.5 I2C Timeout Faults
      4.      A.1.4 Overview of the Fault and Protection Schemes
    2.     A.2 Programming Examples
      1.      A.2.1 Clearing Fault Interrupts
      2.      A.2.2 Disabling Fault Interrupts
      3.      A.2.3 Diagnostic Registers

A.1.3.3 LED Short to GND Faults (GND_LED)

During power line FET pre-charge state, each active LED output pins outputs a typical 6-mA current for 300-µs period. The LED output pin is recognized as short to GND if its voltage is lower than VHEADROOM in this time period. LED short to GND fault will be reported.

During boost soft start and normal boost operation, if LED output is lower than VSHORTGND for 20 ms, device turns off the corresponding LED output channel and output a typical 6-mA current for 300-µs period again. After this operation, if output voltage is still lower than VHEADROOM, LED short to GND fault will be reported.

If LED short to GND is reported, boost, LED outputs and power-line FET is turned off, the device will enter STANDBY mode. LED_STATUS bit is set and an interrupt generated similarly as in open LED case. LED short to GND fault reason can be read from bits LED_GND and LEDx_FAULT (x = 1...4 (LP8864-Q1 & LP8864S-Q1)/ 6 (LP8866-Q1 & LP8866S-Q1)), indicating the faulty LED) in LED_FAULT_STATUS register. These bits maintain their value until device powers are down while the LED_STATUS bit is cleared by the interrupt clearing procedure.