SLVK307 April   2026 SN54SC1G125-SEP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Overview
  5. 2Single-Event Effects (SEE)
  6. 3Test Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5Results
    1. 5.1 Single-Event Latch-up (SEL) Results
    2. 5.2 Single-Event Transients (SET) Results
  9. 6Event Rate Calculations
  10. 7Summary
  11. 8References

Abstract

The purpose of this study is to characterize the single-event effects (SEE) performance due to heavy-ion irradiation of the SN54SC1G125-SEP. SEE performance was verified at minimum (1.1V) and maximum (5.5V) operating conditions. Heavy-ions with an LETEFF of 47MeV-cm2/mg were used to irradiate three production devices with a fluence of 1 × 107 ions/cm2. The results demonstrate that the SN54SC1G125-SEP is SEL-free up to LETEFF = 47MeV-cm2/mg as 125°C. Single-event transient (SET) performance at minimum and maximum operating voltages saw no excursions ≥|2%| trigger up to fluence of 1 × 107 ions/cm2, as shown and discussed in this report.