SLVK307 April   2026 SN54SC1G125-SEP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Overview
  5. 2Single-Event Effects (SEE)
  6. 3Test Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5Results
    1. 5.1 Single-Event Latch-up (SEL) Results
    2. 5.2 Single-Event Transients (SET) Results
  9. 6Event Rate Calculations
  10. 7Summary
  11. 8References

5.1 Single-Event Latch-up (SEL) Results

During SEL characterization, the device was heated using forced hot air, maintaining device temperature at 125°C. A FLIR (FLIR ONE Pro LT) thermal camera was used to validate die temperature to make sure the device was accurately heated (see Figure 4-3.) The species used for SEL testing was a Silver (109Ag) ion at 19.5MeV/µ with an angle-of-incidence of 0° for an LETEFF of 47MeV-cm2/mg. A fluence of approximately 1 × 107 ions/cm2 was used for each run.

The three devices were powered up and exposed to the heavy-ions using the maximum recommended supply voltage of 5.5V using a National Instruments™ PXI Chassis PXIe-4137 on VCC and input A. The run duration to achieve this fluence was approximately 100 seconds. As listed in Table 5-2, no SEL events were observed during the 10 runs, indicating that the SN54SC1G125-SEP is SEL-free. Figure 5-1, Figure 5-2, and Figure 5-3 show the plots of current versus time for runs one, six, and seven, respectively.

Table 5-1 Summary of SN54SC1G125-SEP SEL Test Conditions and Results
Run NumberUnit NumberDistance (mm)Temperature
(°C)		IonAngleFlux
(ions × cm2/mg)		Fluence
(Number of ions)		LETEFF
(MeV × cm2/mg)		Did an SEL Event Occur?
1150125Ag0°1.00E+051.00E+07

47

No
2150125Ag0°1.00E+051.00E+0747No
3150125Ag0°1.00E+051.00E+0747No
4250125Ag0°1.00E+051.00E+0747No
5250125Ag0°1.00E+051.00E+0747No
6250125Ag0°1.00E+051.00E+0747No
7350125Ag0°1.00E+051.00E+0747No
8350125Ag0°1.00E+051.00E+0747No
9350125Ag0°1.00E+051.00E+0747No
10350125Ag0°1.00E+051.50E+0747No
Current versus Time for Run 1 of the SN54SC1G125-SEP at T = 125°CFigure 5-1 Current versus Time for Run 1 of the SN54SC1G125-SEP at T = 125°C
Current versus Time for Run 6 of the SN54SC1G125-SEP at T = 125°CFigure 5-2 Current versus Time for Run 6 of the SN54SC1G125-SEP at T = 125°C
Current versus Time for Run 7 of the SN54SC1G125-SEP at T = 125°CFigure 5-3 Current versus Time for Run 7 of the SN54SC1G125-SEP at T = 125°C

No SEL events were observed, indicating that the SN54SC1G125-SEP is SEL-immune at LETEFF = 47MeV-cm2/mg and T = 125°C. Using the MFTF method shown in Single-Event Effects (SEE) Confidence Internal Calculations , the upper-bound cross section (using a 95% confidence level) is calculated as:

Equation 1. σSEL≤3.69×10-8cm2/device for LETEFF=47 MeV∙cm2/mg and T=125℃